Ptychographic wavefront characterization for single-particle imaging at x-ray lasers
Daurer, Benedikt J. Sala, Simone Hantke, Max F. Reddy, Hemanth K. N. Bielecki, Johan Shen, Zhou Nettelblad, Carl Svenda, Martin Ekeberg, Tomas Carini, Gabriella A.
Sala, Simone
Hantke, Max F.
Reddy, Hemanth K. N.
Bielecki, Johan
Nettelblad, Carl
Svenda, Martin
Ekeberg, Tomas
Carini, Gabriella A.
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Alternative Title
Abstract
A well-characterized wavefront is important for many x-ray free-electron laser (XFEL) experiments, especially for single-particle imaging (SPI), where individual biomolecules randomly sample a nanometer region of highly focused femtosecond pulses. We demonstrate high-resolution multiple-plane wavefront imaging of an ensemble of XFEL pulses, focused by Kirkpatrick-Baez mirrors, based on mixed-state ptychography, an approach letting us infer and reduce experimental sources of instability. From the recovered wavefront profiles, we show that while local photon fluence correction is crucial and possible for SPI, a small diversity of phase tilts likely has no impact. Our detailed characterization will aid interpretation of data from past and future SPI experiments and provides a basis for further improvements to experimental design and reconstruction algorithms. © 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Keywords
Source Title
Optica
Publisher
The Optical Society
Series/Report No.
Collections
Rights
Attribution 4.0 International
Date
2021-04-12
DOI
10.1364/optica.416655
Type
Article