Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
Leong, S.H. Wang, J.P. Low, T.S.
Leong, S.H.
Wang, J.P.
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Abstract
A Magneto-optical Kerr Effect (MOKE) system was built and used for acquiring saturation magnetization curves and measuring the magnetic hardness coefficient, a of magnetic thin film samples. Co thin films were sputtered on glass substrate under various sputtering conditions. The magnetic hardness coefficient was measured using the MOKE setup. Results for a (Oe) were further correlated using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis. It was found that a (Oe), a useful indicator for in-depth defects in Co films, increased with both working and base pressure but decreased with higher deposition temperatures. This trend is in agreement with well-known microstructure control techniques by changing sputtering parameters.
Keywords
In-depth defects, Magnetic hardness coefficient, Magneto-optical Kerr effect, Saturation magnetization curve
Source Title
IEEE Transactions on Magnetics
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Date
2000-09
DOI
10.1109/20.908917
Type
Conference Paper