Zhu Furong

Email Address
elezfr@nus.edu.sg


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    Indium-doped zinc oxide films prepared by simultaneous r.f. and d.c. magnetron sputtering
    (1999) Zhang, K.; Zhu, F.; Huan, C.H.A.; Wee, A.T.S.; Osipowicz, T.; PHYSICS
    Indium-doped zinc oxide (ZnO:In) films were prepared by simultaneous r.f. and d.c. magnetron sputtering. The structural, optical and electrical properties of the films have been obtained by x-ray diffractometry (XRD), Rutherford backscattering spectrometry (RBS), spectrophotometry and atomic force microscopy (AFM) together with four-point probe measurements. The XRD pattern shows ZnO(002) to be the preferred film orientation. The deposited In/Zn atomic ratio is approximately 0.4. Uniform ZnO:In films with a resistivity of approximately 7×10-4Ω.cm and a high transparency (>85%) were achieved, with further optimization possible.
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    A general low-temperature route for large-scale fabrication of highly oriented ZnO nanorod/nanotube arrays
    (2005-03-02) Yu, H.; Zhang, Z.; Han, M.; Hao, X.; Zhu, F.; ELECTRICAL & COMPUTER ENGINEERING; BIOENGINEERING
    Large-scale arrays of highly oriented hexagonal ZnO nanorods and nanotubes were fabricated on arbitrary ZnO-film-coated substrates using a low-temperature chemical-liquid-phase deposition method. The obtained nanoproducts were characterized, and the growth mechanism is proposed. Copyright © 2005 American Chemical Society.