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CHUNG HONG JING

rp10217

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Full Name
CHUNG HONG JING
(not current staff)
Variants
Chung, H.J.
 
Main Affiliation
 
Faculty
 
Email
nnichj@nus.edu.sg
 

Publications

Refined By:
Author:  Sow, C.H.

Results 1-16 of 16 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
117-Sep-2007A new scenario in probe local oxidation: Transient pressure-wave-assisted ionic spreading and oxide pattern formationXie, X.N. ; Chung, H.J. ; Liu, Z.J.; Yang, S.-W.; Sow, C.H. ; Wee, A.T.S. 
21-Mar-2006Creating polymer structures of tunable electric functionality by nanoscale discharge-assisted cross-linking and oxygenationXie, X.N. ; Deng, M. ; Xu, H. ; Yang, S.W.; Qi, D.C. ; Gao, X.Y. ; Chung, H.J. ; Sow, C.H. ; Tan, V.B.C. ; Wee, A.T.S. 
39-Nov-2005Electrical discharge in a nanometer-sized air/water gap observed by atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Adamiak, K.; Wee, A.T.S. 
42007Enhanced probe nano-oxidation by charge pump effect in swept tip voltage cyclesXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
52008Erratum: Micro/nanoscopic patterning of polymeric materials by atomic force microscope assisted electrohydrodynamic nanolithography (Journal of Applied Physics (2008) 103 (024307))Xie, X.N. ; Chung, H.J. ; Bandyopadhyay, D.; Sharma, A.; Sow, C.H. ; Wee, A.T.S. 
62007Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interfaceXie, X.N. ; Chung, H.J. ; Tong, D.M. ; Sow, C.H. ; Wee, A.T.S. 
716-Apr-2007Microdroplet and atomic force microscopy probe assisted formation of acidic thin layers for silicon nanostructuringXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
81-Nov-2006Nanoscale materials patterning and engineering by atomic force microscopy nanolithographyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
914-Jun-2004Native oxide decomposition and local oxidation of 6H-SiC (0001) surface by atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
10Apr-2010Oriented gold nanoparticle-polyaniline nanorods with nanofibers of controlled density on their surfaceXia, H. ; Chung, H.J. ; Sow, C.-H. ; Chan, H.S.-O. 
1121-Apr-2004Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surfaceXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
122006Polymeric conical structure formation by probe-induced electrohydrodynamical nanofluidic motionChung, H.J. ; Xie, X.N. ; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S. 
1323-Jun-2004Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigationXie, X.N. ; Chung, H.J. ; Xu, H. ; Xu, X. ; Sow, C.H. ; Wee, A.T.S. 
1410-Jan-2005Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
153-Jul-2008Two coexisting modes in field-assisted AFM nanopatterning of thin polymer filmsXie, X.N. ; Chung, H.J. ; Bandyopadhyay, D.; Sharma, A.; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S. 
166-Jun-2005Water-bridge-assisted ionic conduction in probe-induced conical polymer pattern formationXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S.