Full Name
Tay Cho Jui
(not current staff)
Variants
Jui, T.C.
Cho, J.T.
Tay, C.-J.
Tay, C.
TAY, CHO JUI
Tay, C.J.
Jui Tay, C.
Tay C.J.
 
Main Affiliation
 
 
Email
mpetaycj@nus.edu.sg
 

Results 141-160 of 260 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
141Aug-1996Measurement of Y-notch tip plastic zone by the laser speckle techniqueTay, C.J. ; Tay, T.E. ; Shang, H.M. 
2Aug-1992Measurements of surface coordinates and slopes by shearographyTay, C.J. ; Shang, H.M. ; Poo, A.N. ; Luo, M.
3Apr-1991Measuring the curvatures of machined surfaces using laser speckle interferometryShang, H.M. ; Chau, F.S. ; Shim, V.P.W. ; Tay, C.J. ; Toh, S.L. 
42002MEF studies for attenuated phase shift mask for sub 0.13 um technology using 248 nmTan, S.K.; Lin, Q.; Chua, G.S.; Quan, C. ; Tay, C.J. 
528-May-2013Methods for enhancing photolithography patterningLING, MOH LUNG; CHUA, GEK SOON; LIN, QUNYING; TAY, CHO JUI ; QUAN, CHENGGEN 
62008Micro-components evaluation using laser interferometryTay, C.J. 
715-May-2011Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.; Gao, Z.
8Oct-2002Microscopic surface contouring by fringe projection methodQuan, C. ; Tay, C.J. ; He, X.Y.; Kang, X. ; Shang, H.M. 
9Jan-1987MODELING OF THE HYDROFORMING OF SHEET MATERIALS CLAMPED WITH VARYING BLANK HOLDING LOADS.Shang, H.M. ; Chau, F.S. ; Lee, K.H. ; Tay, C.J. ; Toh, S.L. 
10Feb-2004Modified Rayleigh criterion for 90 nm lithography technologies and belowChua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.
1124-May-2010Motion detection using extended fractional Fourier transform and digital speckle photographyBhaduri, B. ; Tay, C.J. ; Quan, C. ; Sheppard, C.J.R. 
122010Motion detection using speckle photography and extended fractional Fourier transformBhaduri, B. ; Tay, C.J. ; Quan, C. 
1320-Jun-2011Multichannel Fourier-transform interferometry for fast signalsHeussler, S.P. ; Moser, H.O. ; Kalaiselvi, S.M. ; Quan, C.G. ; Tay, C.J. 
141-Feb-2008Nanoindentation techniques in the measurement of mechanical properties of InP-based free-standing MEMS structuresTay, C.J. ; Quan, C. ; Gopal, M.; Shen, L.; Akkipeddi, R.
15Jan-2006Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometryQuan, C. ; Wang, S.H. ; Tay, C.J. 
161999New method for generating high visibility digital speckle shearing fringe patternHe, Y.M.; Tay, C.J. ; Shang, H.M. 
17Jun-2003New method for measuring dynamic response of small components by fringe projectionTay, C.J. ; Quan, C. ; Shang, H.M. ; Wu, T.; Wang, S. 
181999New method for phase analysis in speckle shearing interferometerHe, Y.M.; Tay, C.J. ; Shang, H.M. 
19May-2010Non-contact evaluation of the resonant frequency of a microstructure using ultrasonic waveKang, X.; He, X.Y.; Tay, C.J. ; Quan, C. 
202009Non-destructive evaluation of MEMS components by optical methodsTay, C.J. ; Quan, C. ; Wang, S.H.