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Li Wenming
rp08149
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Full Name
Li Wenming
Variants
Li, W.
Li, W.M.
Main Affiliation
MATERIALS SCIENCE
Faculty
SCIENCE
Publications
All
Articles
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Author
7
Ding, J.
7
Li, W.M.
6
Shi, J.Z.
4
Chen, Y.J.
4
Huang, T.L.
.
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Department
9
MATERIALS SCIENCE
9
MATERIALS SCIENCE AND ENGINEERING
7
COLLEGE OF DESIGN AND ENGINEERING
2
PHYSICS
1
DEAN'S OFFICE (COLLEGE OF DESIGN & ENG)
.
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Subject
2
Switching field distribution
1
Bit patterned media
1
Bit-patterned media
1
Capped layer
1
capped media
.
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Type
5
Conference Paper
4
Article
Date Issued
7
2010 - 2019
2
2000 - 2009
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Results 1-9 of 9 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
1
1-Apr-2012
Angular dependence and temperature effect on switching field distribution of Co/Pd based bit patterned media
Li, W.M.
;
Huang, X.L.
;
Shi, J.Z.
;
Chen, Y.J.
;
Huang, T.L.
;
Ding, J.
2
1-Apr-2011
Calculation of individual bit island switching field distribution in perpendicular magnetic bit patterned media
Li, W.M.
;
Chen, Y.J.
;
Huang, T.L.
;
Xue, J.M.
;
Ding, J.
3
Feb-2012
Individual bit island reversal and switching field distribution in perpendicular magnetic bit patterned media
Chen, Y.J.
;
Huang, T.L.
;
Shi, J.Z.
;
Deng, J.
;
Ding, J.
;
Li, W.M.
;
Leong, S.H.
;
Zong, B.Y.
;
Ko, H.Y.Y.
;
Hu, S.B.
;
Zhao, J.M.
4
8-May-2013
Influence of bias voltage on the switching behaviour of CoCrPt-Si O2 perpendicular recording media
Li, W.M.
;
Shi, J.Z.
;
Lim, W.K.
;
Ding, J.
5
Apr-2012
Study of magnetization reversal of Co/Pd bit-patterned media by micro-magnetic simulation
Li, W.M.
;
Yang, Y.
;
Chen, Y.J.
;
Huang, T.L.
;
Shi, J.Z.
;
Ding, J.
6
1-Oct-2001
Surface photovoltaic properties of sputtered Mo/Si multilayers
Li, W.
;
Gong, H.
;
Cao, Y.
;
Du, H.
7
2012
The effect of capped layer thickness on switching behavior in coupled granular/continuous media
Li, W.M.
;
Lim, W.K.
;
Shi, J.Z.
;
Ding, J.
8
Aug-2013
The effect of capped layer thickness on switching behavior in perpendicular CoCrPt based coupled granular/continuous media
Li, W.M.
;
Lim, W.K.
;
Shi, J.Z.
;
Ding, J.
9
20-Jan-2002
X-ray analysis and microhardness characterization of TiN/Ti multilayers
Li, W.
;
Gong, H.
;
Cai, J.
;
Wang, Y.
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