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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 61-80 of 169 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
612010Determination of the local electric field strength near electric breakdownGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
621997Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysisOsipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
632010Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performanceJoshi, P.; Steen, S.; Sivakumar, K.; Yang, W.K.; Rossnagel, S.; Mittal, S.; Steiner, M.; Neumayer, D.; Kim, Y.H.; Nagalingam, D. ; Meng, L.; Bhatia, C.S. ; Phang, J.C.H. 
64May-1995Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configurationChan, Daniel S.H. ; Ong, Vincent K.S. ; Phang, Jacob C.H. 
65Sep-2011Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced currentMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
6621-Nov-1995Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electronsCHAN, DANIEL S. H. ; LEONG, KIN ; PHANG, JACOB C. H. 
6726-Sep-2011Dyadic Green's function for aplanatic solid immersion lens based sub-surface microscopyHu, L. ; Chen, R.; Agarwal, K. ; Sheppard, C.J.R. ; Phang, J.C.H. ; Chen, X. 
68Nov-1995Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam testerSim, K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
69May-2011Effect of polarization on a solid immersion lens of arbitrary thicknessLim, K.M.; Lee, G.C.F.; Sheppard, C.J.R. ; Phang, J.C.H. ; Wong, C.L.; Chen, X. 
702008Effect of refractive solid immersion lens parameters on the enhancement of laser induced fault localization techniquesSh, G.; Act, Q.; Cjr, S. ; Cm, C.; Ls, K.; Jch, P. 
712008Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniquesGoh, S.H.; Quah, A.C.T.; Sheppard, C.J.R. ; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
72Jan-2004Effect of Shot Noise and Secondary Emission Noise in Scanning Electron Microscope ImagesSim, K.S. ; Thong, J.T.L. ; Phang, J.C.H. 
732009Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-systemTiedemann, A.-K.; Heiderhoff, R.; Balk, L.J.; Phang, J.C.H. 
741-Jan-1988ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.Chim, W.K. ; Low, T.S. ; Chan, D.S.H. ; Phang, J.C.H. 
752006Enhanced detection sensitivity with pulsed laser digital signal integration algorithmQuah, A.C.T.; Phang, J.C.H. ; Koh, L.S.; Tan, S.H.; Chua, C.M.
762004Enhanced pixel by pixel emissivity correction for thermal microscopyGoh, S.H.; Yim, K.H.; Phang, J.C.H. ; Balk, L.J.
77Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
781-Sep-1997Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
791998Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescenceLiu, X.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. 
80Sep-1987Experimentally observed deviations from the superposition principle in crystalline silicon solar cells at low illuminationsChan, D.S.H. ; Phang, J.C.H. ; Wong, H.W.