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Phang, J.C.H.

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Results 101-120 of 169 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
101Sep-2002Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)Lee, T.H. ; Guo, X.; Shen, G.D.; Ji, Y.; Wang, G.H.; Du, J.Y.; Wang, X.Z.; Gao, G.; Altes, A.; Balk, Lj.; Phang, J.C.H. 
1022005Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopyHendarto, E.; Altes, A.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
1031997Ion Beam Induced Charge imaging for the failure analysis of semiconductor devicesKolachina, S.; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Sanchez, J.L.; Watt, F. 
10421-Jan-2004Ion beam induced charge microscopy studies of power diodesZmeck, M.; Balk, L.J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
1052009Laser timing probe with frequency mapping for locating signal maximaKoh, L.S.; Marks, H.; Ross, L.K.; Chua, C.M.; Phang, J.C.H. 
106Aug-2008Laser-induced detection sensitivity enhancement with laser pulsingQuah, A.C.T.; Chua, C.M.; Tan, S.H.; Koh, L.S.; Phang, J.C.H. ; Tan, T.L.; Gan, C.L.
1072007Localization of Cu/low-k interconnect reliability defects by pulsed laser induced techniqueTan, T.L.; Quah, A.C.T.; Gan, C.L.; Phang, J.C.H. ; Chua, C.M.; Ng, C.M.; Du, A.-Y.
10823-Jan-1996Method and apparatus for measuring quantitative voltage contrastCHIM, WAI K. ; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
109Oct-2004Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror opticsChan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V.
101997Miniature scanning electron microscope design based upon the use of permanent magnetsKhursheed, A. ; Thong, J.T.L. ; Phang, J.C.H. ; Ong, I.P.
111997Miniature scanning electron microscope design based upon the use of permanent magnetsKhursheed, A. ; Thong, J.T.L. ; Phang, J.C.H. ; Ong, I.P.
122010Mobile diffractive solid immersion lens design for backside laser based fault localizationGoh, S.H.; Cho, J.Y.; Lam, J.; Phang, J.C.H. 
13Sep-2003Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopyZmeck, M.; Balk, L.; Osipowicz, T. ; Watt, F. ; Phang, J. ; Khambadkone, A. ; Niedernostheide, F.-J.; Schulze, H.-J.
14Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
15Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
1629-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
17Aug-2008Near-field detection of photon emission from silicon with 30 nm spatial resolutionIsakov, D.; Tio, A.A.B.; Geinzer, T.; Phang, J.C.H. ; Zhang, Y.; Balk, L.J.
182008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
192007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
207-Jul-2011Negative backside thermoreflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H.