Osipowicz Thomas

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Full Name

Osipowicz Thomas

Variants

Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas

Main Affiliation

PHYSICS

Faculty

FAC OF SCIENCE

phyto@nus.edu.sg

Results 181-186 of 186 (Search time: 0.014 seconds).

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	Issue Date	Title	Author(s)
181	2002	Thickness effect on nickel silicide formation and thermal stability for ultra shallow junction CMOS	Zhao, F.F.; Shen, Z.X. ; Zheng, J.Z.; Gao, W.Z.; Osipowicz, T. ; Pang, C.H.; Lee, P.S.; See, A.K.
2	1996	Unconnected junction contrast in ion beam induced charge microscopy	Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.
3	Dec-2003	Via resistance reduction using "cool" PVD-Ta processing	Seet, C.S.; Zhang, B.C.; Yong, C.; Liew, S.L.; Li, K.; Hsia, L.C.; Seng, H.L. ; Osiposwicz, T. ; Sudijono, J.; Zeng, H.C. ; Tan, J.B.
4	2008	World-wide lightning location using VLF propagation in the Earth-ionosphere waveguide	Dowden, R.L.; Holzworth, R.H.; Rodger, C.J.; Lichtenberger, J.; Thomson, N.R.; Jacobson, A.R.; Lay, E.; Brundell, J.B.; Lyons, T.J.; O'Keefe, S.; Kawasaki, Z.; Price, C.; Prior, V.; Ortéga, P.; Weinman, J.; Mikhailov, Y.; Veliz, O.; Qie, X.; Burns, G.; Collier, A.; Pinto, O.; Diaz, R.; Adamo, C.; Williams, E.R.; Kumar, S.; Raga, G.B.; Rosado, J.M.; Avila, E.E.; Clilverd, M.A.; Ulich, T.; Gorham, P.; Shanahan, T.J.G.; Osipowicz, T. ; Cook, G.; Zhao, Y.
5	2002	X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium films	Leoy, C.C.; Choi, W.K. ; Wong, K.L. ; Wong, K.M. ; Osipowicz, T. ; Rong, J.
6	2003	Yellow luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescence	Teo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.S.; Chua, S.J. ; Liu, Y.Y.