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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Results 121-140 of 186 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1212005Observation of a new kinetics to form Ni3Si2 and Ni31Si12 suicides at low temperature (200°C)Rahman, Md..A.; Osipowicz, T. ; Chi, D.Z.; Wang, W.D.
122Nov-2005Observation of local lattice tilts in strain-relaxed Si 1-xGex using high resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Zhang, J.; Tok, E.S. 
32005On the morphological changes of Ni- and Ni(Pt)-silicidesLee, P.S.; Pey, K.L.; Mangelinck, D.; Chi, D.Z.; Osipowicz, T. 
410-Jul-2007Optical and physical properties of solgel-derived GeO2:SiO 2 films in photonic applicationsHo, C.K.F.; Rajni; Djie, H.S.; Pita, K.; Ngo, N.Q.; Osipowicz, T. 
5May-2002Optimal geometry for GeSi/Si super-lattice structure RBS investigationWielunski, L.S.; Osipowicz, T. ; Teo, E.J. ; Watt, F. ; Tok, E.S. ; Zhang, J.
62007Orders of magnitude reduction in threading dislocations in ZnO grown on facet-controlled GaNChua, S.J. ; Zhou, H.L.; Pan, H. ; Osipowicz, T. 
72008Performance enhancement schemes featuring lattice mismatched S/D stressors concurrently realized on CMOS platform: e-SiGeSn S/D for pFETs by Sn+ implant and SiC S/D for nFETs by C+ implantWang, G.H.; Toh, E.-H.; Wang, X.; Seng, D.H.L.; Tripathy, S.; Osipowicz, T. ; Tau, K.C.; Samudra, G. ; Yeo, Y.-C. 
82007Phase and texture of Er-germanide formed on Ge(001) through a solid-state reactionLiew, S.L.; Balakrisnan, B.; Ho, C.S.; Thomas, O. ; Chi, D.Z.
92005Plasma graft copolymerization of 4-vinylpyridine on dense and porous SiLK for electroless plating of copper and for retardation of copper diffusionZhu, Y.Q.; Kang, E.T. ; Neoh, K.G. ; Osipowicz, T. ; Chan, L.
1022-Apr-2002Probing the SiGe virtual substrate by high-resolution channeling contrast microscopySeng, H.L. ; Osipowicz, T. ; Sum, T.C. ; Tok, E.S. ; Breton, G.; Woods, N.J.; Zhang, J.
1121-Jun-2001Properties of electroplated copper thin film and its interfacial reactions in the EPCu/IMPCu/IMPTaN/SiO2/Si multilayer structureLatt, K.M.; Lee, K.; Osipowicz, T. ; Lee, Y.K.
12May-2002Proton beam micromachined resolution standards for nuclear microprobesWatt, F. ; Rajta, I. ; Van Kan, J.A. ; Bettiol, A.A. ; Osipowicz, T. 
131-Jul-2009Proton beam writing and electroplating for the fabrication of high aspect ratio Au microstructuresYue, W. ; Ren, Y.; van Kan, J.A. ; Chiam, S.-Y. ; Jian, L. ; Moser, H.O. ; Osipowicz, T. ; Watt, F. 
14Oct-2008Proton beam writing: A platform technology for nanowire productionVan Kan, J.A. ; Zhang, F. ; Chiam, S.Y. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. 
15Mar-2007Proton beam writing: A tool for high-aspect ratio mask productionVan Kan, J.A. ; Shao, P.G. ; Ansari, K. ; Bettiol, A.A. ; Osipowicz, T. ; Watt, F. 
162-Sep-1999Proton micromachining of substrate scaffolds for cellular and tissue engineeringSanchez, J.L.; Guy, G. ; Van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
17Feb-2000Proton micromachining: A new technique for the production of three-dimensional microstructuresVan Kan, J.A. ; Sanchez, J.L.; Osipowicz, T. ; Watt, F. 
182-Aug-2021Quantifying nanodiamonds biodistribution in whole cells with correlative iono-nanoscopyMi, Zhaohong ; Chen, Ce-Belle ; Tan, Hong Q; Dou, Yanxin ; Yang, Chengyuan ; Turaga, Shuvan Prashant ; Ren, Minqin ; Vajandar, Saumitra K ; Yuen, Gin Hao ; Osipowicz, Thomas ; Watt, Frank ; Bettiol, Andrew A 
192008Quantitative studies of copper diffusion through Ultra-thin ALD tantalum nitride barrier films by high resolution-RBSHo, C.S.; Liew, S.L.; Chan, T.K. ; Malar, P. ; Osipowicz, T. ; Lu, L. ; Lim, C.Y.H. 
20Nov-2001Rapid thermal oxidation of radio frequency sputtered polycrystalline Si1-xGex thin filmsNatarajan, A.; Bera, L.K. ; Choi, W.K. ; Osipowicz, T. ; Seng, H.L.