Ong Keng Sian Vincent

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Full Name

Variants

Ong, V.K.S.
Ong, Vincent K.S.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

Refined By:

Department: PHYSICS

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	Issue Date	Title	Author(s)
1	1997	Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis	Osipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
2	Feb-1996	New developments in beam induced current methods for the failure analysis of VLSI circuits	Chan, D.S.H. ; Phang, J.C.H. ; Lau, W.S. ; Ong, V.K.S. ; Sane, V. ; Kolachina, S.; Osipowicz, T. ; Watt, F.
3	Jul-1997	Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC	Osipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
4	1996	Unconnected junction contrast in ion beam induced charge microscopy	Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Watt, F.