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Wai Kin Chim

rp04472

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Full Name
Wai Kin Chim
Variants
CHIM, WAI KIN
Chim, W.-K.
CBIM, W. K.
CHIM, WAI K.
Chim, W.K.
KIN, CHIM WAI
Chim Wai Kin
 
Main Affiliation
 
Faculty
 
Email
elecwk@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]

Results 1-20 of 95 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
12004A MONOS-type flash memory using a high-k HfAlO charge trapping layerTan, Y.N.; Chim, W.K. ; Cho, B.J. ; Choi, W.K. 
2Mar-2006Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurementHong, Y.D.; Yeow, Y.T.; Chim, W.K. ; Yan, J.; Wong, K.M. 
3May-2001Analysis of the DCIV peaks in electrically stressed pMOSFETsJie, B.B.; Chim, W.K. ; Li, M.-F. ; Lo, K.F.
423-Oct-2000Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressingLim, P.S.; Chim, W.K. 
52008Band alignment of yttrium oxide on various relaxed and strained semiconductor substratesChiam, S.Y.; Chim, W.K. ; Pi, C.; Huan, A.C.H.; Wang, S.J.; Pan, J.S.; Turner, S.; Zhang, J.
61-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
720-Sep-2004Clarifying the origin of near-infrared electroluminescence peaks for nanocrystalline germanium in metal-insulator-silicon structuresKan, E.W.H.; Chim, W.K. ; Lee, C.H.; Choi, W.K. ; Ng, T.H.
8Dec-2001Combined low-frequency noise and resistance measurements for void extraction in deep-submicrometer interconnectsChu, L.W.; Chim, W.K. ; Pey, K.L. ; Yeo, J.Y.K.; Chan, L.
9Feb-2009Comparison of the synthesis of Ge nanocrystals in hafnium aluminum oxide and silicon oxide matricesChew, H.G.; Zheng, F.; Choi, W.K. ; Chim, W.K. ; Fitzgerald, E.A.; Foo, Y.L.
102006Conductance-voltage measurements on germanium nanocrystal memory structures and effect of gate electric field couplingNg, T.H.; Chim, W.K. ; Choi, W.K. 
112004Confinement of nanocrystals and possible charge storage mechanism for MIS memory devices with ge nanocrystals embedded in SiO 2Ho, V.; Choi, W.K. ; Chim, W.K. ; Teo, L.W.; Du, A.Y.; Tung, C.H.
122004Confinement of nanocrystals and possible charge storage mechanism for MIS memory devices with ge nanocrystals embedded in SiO 2Ho, V.; Choi, W.K. ; Chim, W.K. ; Teo, L.W.; Du, A.Y.; Tung, C.H.
132004Confinement of nanocrystals and possible charge storage mechanism for MIS memory devices with ge nanocrystals embedded in SiO 2Ho, V.; Choi, W.K. ; Chim, W.K. ; Teo, L.W.; Du, A.Y.; Tung, C.H.
142007Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extractionWong, K.M. ; Chim, W.K. 
1524-Jun-2002Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulationChim, W.K. ; Wong, K.M. ; Teo, Y.L.; Lei, Y. ; Yeow, Y.T.
162004Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dVHong, Y.D.; Yan, J.; Wong, K.M. ; Yeow, Y.T.; Chim, W.K. 
178-Sep-2003Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrixKan, E.W.H.; Choi, W.K. ; Leoy, C.C.; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
1828-Apr-2006Effect of germanium concentration and oxide diffusion barrier on the formation and distribution of germanium nanocrystals in silicon oxide matrixChew, H.G.; Choi, W.K. ; Foo, Y.L.; Zheng, F.; Chim, W.K. ; Voon, Z.J.; Seow, K.C.; Fitzgerald, E.A.; Lai, D.M.Y.
1927-Oct-2003Effect of germanium concentration and tunnel oxide thickness on nanocrystal formation and charge storage/retention characteristics of a trilayer memory structureHo, V.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Tay, M.S.; Antoniadis, D.A.; Fitzgerald, E.A.; Du, A.Y.; Tung, C.H.; Liu, R. ; Wee, A.T.S. 
202001Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurementsChu, L.W.; Chim, W.K. ; Pey, K.L. ; See, A.