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Eng Fong Chor

rp04127

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Full Name
Eng Fong Chor
Variants
Chor, E.F.
CHOR, ENG FONG
Chor, E.-F.
Eng, F.C.
Chor, Eng Fong
 
Main Affiliation
 
Faculty
 
Email
elecef@nus.edu.sg
 
Other emails
 

Publications

Refined By:
Date Issued:  [2010 TO 2019]

Results 1-11 of 11 (Search time: 0.013 seconds).

Issue DateTitleAuthor(s)
1Jun-2010Contact resistance reduction technology using aluminum implant and segregation for strained p-FinFETs with silicongermanium source/drainSinha, M.; Lee, R.T.P. ; Chor, E.F. ; Yeo, Y.-C. 
2May-2011Doping-free fabrication of n-type random network single-walled carbon nanotube field effect transistor with yttrium contactsHUANG LEIHUA ; Chor, E.F. ; Wu, Y. 
83Apr-2010Fabrication of single-walled carbon nanotube Schottky diode with gold contacts modified by asymmetric thiolate moleculesHuang, L. ; Chor, E.F. ; Wu, Y. ; Guo, Z.
842013Gold-free InAlN/GaN schottky Gate HEMT on Si(111) substrate with ZrO 2 PassivationKyaw, L.M.; Liu, Y.; Bera, M.K.; Ngoo, Y.J.; Tripathy, S.; Chor, E.F. 
852010Impact of Al2O3 incorporation on device performance of HfO2 gate dielectric AlGaN/GaN MIS-HFETsTian, F.; Chor, E.F. 
862010Improved electrical performance and thermal stability of HfO2 / Al2 O3 bilayer over HfO2 gate dielectric AlGaN/GaN MIS-HFETsTian, F.; Chor, E.F. 
872014Influence of RuOx Gate Thermal Annealing on Electrical Characteristics of AlxGa1-xN/GaN HEMTs on 200-mm SiliconKyaw, L.M.; Dolmanan, S.B.; Bera, M.K.; Liu, Y.; Tan, H.R.; Bhat, T.N.; Dikme, Y.; Chor, E.F. ; Tripathy, S.
882010Investigations of niobium carbide contact for carbon-nanotube-based devicesHuang, L. ; Chor, E.F. ; Wu, Y. ; Guo, Z.
89Sep-2010Nickel-silicide contact technology with dual near-band-edge barrier heights and integration in CMOS FinFETs with single maskSinha, M.; Chor, E.F. ; Yeo, Y.-C. 
901-Oct-2010Physical and electrical characteristics of hafnium oxide films on AlGaN/GaN heterostructure grown by pulsed laser depositionTian, F.; Chor, E.F. 
912013Thickness dependent electrical characteristics of InAlN/GaN-on-Si MOSHEMTs with Y2O3 gate dielectric and Au-free ohmic contactBera, M.K.; Liu, Y.; Kyaw, L.M.; Ngoo, Y.J.; Chor, E.F.