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Ang Diing Shenp

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Full Name
Ang Diing Shenp
Variants
Ang, D.S.
 
Main Affiliation
 
Faculty
 

Publications

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Subject:  Hot-carrier degradation

Results 1-2 of 2 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Mar-1999A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET'sAng, D.S. ; Ling, C.H. 
2Jan-1998A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET'sAng, D.S. ; Ling, C.H.