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Ang Diing Shenp

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Full Name
Ang Diing Shenp
Variants
Ang, D.S.
 
Main Affiliation
 
Faculty
 

Publications

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Type:  Article
Department:  ELECTRICAL ENGINEERING
Author:  Ang, D.S.
Date Issued:  1995

Results 1-3 of 3 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
1Aug-1995Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET'sLing, C.H. ; Ang, D.S. ; Tan, S.E.
2Jul-1995Study of hot carrier degradation in NMOSFET's by gate capacitance and charge pumping currentLing, C.H. ; Tan, S.E.; Ang, D.S. 
3Jun-1995Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature annealsAng, D.S. ; Ling, C.H. ; Yeow, Y.T.