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Krzysztof Banas

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Full Name
Krzysztof Banas
Variants
Banas K.
Banaś, K.
Banas, K.
Banas, Krzysztof
 
Main Affiliation
 
Faculty
 
Email
slskb@nus.edu.sg
 

Publications

Refined By:
Author:  Lim, S.K.

Results 1-7 of 7 (Search time: 0.008 seconds).

Issue DateTitleAuthor(s)
1Oct-2012Application of synchrotron radiation based techniques in forensic scienceBanas, K. ; Banas, A. ; Heussler, S.P. ; Kalaiselvi, S.M. ; Lim, S.K.; Loke, J.; Breese, M.B.H. 
27-Aug-2012Detection of microscopic particles present as contaminants in latent fingerprints by means of synchrotron radiation-based Fourier transform infra-red micro-imagingBanas, A. ; Banas, K. ; Breese, M.B.H. ; Loke, J.; Heng Teo, B.; Lim, S.K.
31-Apr-2010Multivariate analysis techniques in the forensics investigation of the postblast residues by means of fourier transform-infrared spectroscopyBanas, K. ; Banas, A. ; Moser, H.O. ; Bahou, M. ; Li, W. ; Yang, P. ; Cholewa, M.; Lim, S.K.
410-Nov-2009Post-blast detection of traces of explosives by means of Fourier transform infrared spectroscopyBanas, A. ; Banas, K. ; Bahou, M. ; Moser, H.O. ; Wen, L. ; Yang, P. ; Li, Z.J. ; Cholewa, M. ; Lim, S.K.; Lim, Ch.H.
522-Apr-2014Spectroscopic detection of exogenous materials in latent fingerprints treated with powders and lifted off with adhesive tapesBanas, A. ; Banas, K. ; Breese, M.B.H. ; Loke, J.; Lim, S.K.
6Feb-2011Synchrotron-based fourier transform infrared spectroscopy and statistic analysis in detection of post-blast traces of explosive materialsBanas, A. ; Banas, K. ; Moser, H.O.; Bahou, M. ; Li, W. ; Yang, P. ; Cholewa, M.; Lim, S.K.
7Oct-2012Synchrotron-based fourier transform infrared spectroscopy and statistic analysis in detection of post-blast traces of explosive materialsBanas, A. ; Banas K. ; Moser, H.O.; Bahou M. ; Li W. ; Yang P. ; Cholewa M.; Lim, S.K.