Skip navigation
Home
Research Outputs
View research outputs
Deposit publication / dataset
Researchers
Help
FAQs
Contact us
Guidelines
Log in
ScholarBank@NUS
He Yandong
rp02888
Collaboration Map
View Statistics
Email Alert
RSS Feed
Profile
Other
Profile
Full Name
He Yandong
Variants
He, Y.
He, Y.D.
Main Affiliation
ELECTRICAL AND COMPUTER ENGINEERING
Faculty
FAC OF ENGINEERING
Publications
All
Articles
Show/Hide filters
Author
1
Cho, B.J.
1
Dong, Z.
1
He, Y.
1
Li, M.-F.
Department
1
ELECTRICAL ENGINEERING
Subject
1
Direct tunneling
1
MOS devices
Type
1
Article
Date Issued
1
2000
Close filters
Refined By:
Author:
Guan, H.
Department:
ELECTRICAL AND COMPUTER ENGINEERING
Subject:
Oxide breakdown
Results 1-1 of 1 (Search time: 0.003 seconds).
Refman
EndNote
Bibtex
RefWorks
Excel
CSV
PDF
Send via email
Issue Date
Title
Author(s)
1
Aug-2000
A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFET's
Guan, H.
;
Li, M.-F.
;
He, Y.
;
Cho, B.J.
;
Dong, Z.
Claim Researcher Page
Contact via feedback form
If you want contact administrator site clicking the follow button