1. ScholarBank@NUS

Thye Shen, Andrew Wee

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Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [1905 TO 1999]

Results 1-20 of 59 (Search time: 0.029 seconds).

Issue DateTitleAuthor(s)
1Oct-1999(2×1) Oxygen superstructure on Cu(210) surface studied by quantitative LEED analysis and STMTan, K.C.; Guo, Y.P. ; Wee, A.T.S. ; Huan, C.H.A. 
2Jan-1994A comparative study of the initial oxygen and water reactions on germanium and silicon using simsWee, A.T.S. ; Huan, C.H.A. ; Thong, P.S.P.; Tan, K.L. 
31997A microstructural study on the surface and interface of CdTe/CdS solar cellsLi, K.; Wee, A.T.S. ; Lin, J. ; Tan, K.L. ; Zhou, L. ; Li, S.F.Y. ; Feng, Z.C.; Chou, H.C.; Kamra, S.; Rohatgi, A.
420-Jun-1997A surface and interface study on the InSb/GaAs heterostructuresLi, K.; Wee, A.T.S. ; Lin, J. ; Lee, K.K.; Watt, F. ; Tan, K.L. ; Feng, Z.C.; Webb, J.B.
51-Jun-1997AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beamsPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
6Dec-1996AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantationPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
71-Dec-1995An alternative method for determining the transmission function of secondary ion mass spectrometersLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
8Jan-1994An investigation of the Ar+ ion-enhanced reaction of CCl4 on Si(100) by secondary ion mass spectrometryWee, A.T.S. ; Huan, C.H.A. ; Tan, K.L. ; Tan, R.S.K.
915-Mar-1996Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
1015-Dec-1996Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
1121-Sep-1997ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
12Nov-1998Atomic force microscopy investigation of the O2 +-induced surface topography of InPPan, J.S. ; Tay, S.T.; Huan, C.H.A. ; Wee, A.T.S. 
13Jul-1998Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAsPan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L. 
1411-Dec-1998Bromine etching of mesoscopic structures on Cu(210): A scanning tunneling microscopy studyWee, A.T.S. ; Fishlock, T.W.; Dixon, R.A.; Foord, J.S.; Egdell, R.G.; Pethica, J.B.
151995Chili protects against aspirin-induced gastroduodenal mucosal injury in humansYeoh, K.G. ; Kang, J.Y. ; Yap, I. ; Guan, R. ; Tan, C.C.; Wee, A. ; Teng, C.H. 
161999Compositional and morphological analysis of InxGa1-xN/GaN epilayersLi, K.; Wee, A.T.S. ; Lin, J. ; Feng, Z.C. ; Lau, E.W.P.
1715-Feb-1996Correlations between CdTe/CdS/SnO2/glass solar cell performance and the interface/surface propertiesFeng, Z.C.; Chou, H.C.; Rohatgi, A.; Lim, G.K.; Wee, A.T.S. ; Tan, K.L. 
181999Crystalline carbon nitride deposition by r.f.-PECVD using a C2H4-NH3-H2 source gas mixtureLim, S.F.; Wee, A.T.S. ; Lin, J. ; Chua, D.H.C.
19Oct-1999Determination of multilayer relaxations of the Cu(210) stepped surface by calculation of LEED intensitiesGuo, Y.P. ; Tan, K.C.; Wee, A.T.S. ; Huan, C.H.A. 
20Jan-1995Development of chemical beam epitaxy for the deposition of gallium nitrideKingsley, C.R.; Whitaker, T.J.; Wee, A.T.S. ; Jackman, R.B.; Foord, J.S.