Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Refined By:
Date Issued:  [2000 TO 2023]
Date Issued:  [2000 TO 2009]
Date Issued:  2001

Results 21-33 of 33 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
21Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
222001Study of Cu diffusion in Cu/Tan/SiO2/Si multilayer structuresZhang, D.H.; Loh, S.W.; Li, C.Y.; Foo, P.D.; Xie, J.; Liu, R. ; Wee, A.T.S. ; Zhang, L.; Lee, Y.K.
23Mar-2001Study of electronic properties and bonding configuration at the BN/SiC interfaceWang, H.-Q. ; Zheng, J.-C. ; Wee, A.T.S. ; Huan, C.H.A. 
242001Study of the morphological modifications induced by laser annealing of preamorphized siliconChong, Y.F.; Pey, K.L. ; Lu, Y.F. ; Wee, A.T.S. ; See, A.
252001Surface Review and Letter: PrefaceLoh, K.-P. ; Sim, W.-S. ; Tsong, T.T.; Wee, A.T.S. 
261-Jun-2001Synthesis of well-aligned multiwalled carbon nanotubes on Ni catalyst using radio frequency plasma-enhanced chemical vapor depositionHo, G.W. ; Wee, A.T.S. ; Lin, J. ; Tjiu, W.C.
2715-May-2001The alloying effect of Ni on the corrosion behavior of melt-spun Mg-Ni ribbonsYao, H.B.; Li, Y. ; Wee, A.T.S. ; Chai, J.W.; Pan, J.S. 
281-May-2001The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffractionXie, X.N. ; Wang, H.Q. ; Wee, A.T.S. ; Loh, K.P. 
292001The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profilingLau, G.S.; Tok, E.S. ; Wee, A.T.S. ; Liu, R. ; Lim, S.L. 
304-Jun-2001The structural and electronic properties of (AlN)x(C2)1-x and (AlN)x(BN)1-x alloysZheng, J.-C. ; Wang, H.-Q. ; Huan, C.H.A. ; Wee, A.T.S. 
3110-Sep-2001Trends in bonding configuration at SiC/III-V semiconductor interfacesZheng, J.-C. ; Wang, H.-Q. ; Wee, A.T.S. ; Huan, C.H.A. 
32Sep-2001Ultra shallow secondary ion mass spectrometry depth profiling: Limitation of sample rotation in improving depth resolutionNg, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.
332001X-ray photoelectron spectroscopic study of InGaAsN grown by MOCVDChang, W.; Lin, J. ; Zhou, W.; Chua, S.J. ; Liu, Y.J. ; Wee, A.T.S.