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BRAM HOEX

rp02267

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Full Name
BRAM HOEX
(not current staff)
Variants
Hoex, B.
Hoex, Bram
 
Main Affiliation
 
Faculty
 
Email
serbh@nus.edu.sg
 

Publications

Results 21-40 of 60 (Search time: 0.011 seconds).

Issue DateTitleAuthor(s)
212014Excellent surface passivation of heavily doped p+ silicon by low-temperature plasma-deposited SiOx/SiNy dielectric stacks with optimised antireflective performance for solar cell applicationDuttagupta, S.; Ma, F.-J. ; Hoex, B. ; Aberle, A.G. 
22013Excellent surface passivation of silicon at low cost: Atomic layer deposited aluminium oxide from solar grade TMALin, F.; Nandakumar, N.; Dielissen, B.; Gortzen, R.; Hoex, B. 
323-Dec-2013Extracting physical properties of arbitrarily shaped laser-doped micro-scale areas in semiconductorsHeinrich, M.; Kluska, S.; Hameiri, Z.; Hoex, B. ; Aberle, A.G. 
42013Extremely low surface recombination velocities on heavily doped planar and textured p+ silicon using low-temperature positively-charged PECVD SiOx/SiNx dielectric stacks with optimised antireflective propertiesDuttagupta, S.; Ma, F.-J.; Hoex, B. ; Aberle, A.G. 
52014Geometric confinement of directly deposited features on hydrophilic rough surfaces using a sacrificial layerLiu, L.; Wang, X.; Lennon, A.; Hoex, B. 
62011High-quality surface passivation of low-resistivity p-type C-Si by hydrogenated amorphous silicon nitride deposited by industrial-scale microwave PECVDDutta Gupta, S.; Hoex, B. ; Lin, F. ; Mueller, T.; Aberle, A.G. 
728-Jul-2013Identification of geometrically necessary dislocations in solid phase crystallized poly-SiLaw, F.; Yi, Y.; Hidayat; Widenborg, P.I. ; Luther, J. ; Hoex, B. 
828-Jul-2013Identification of geometrically necessary dislocations in solid phase crystallized poly-SiLaw, F.; Yi, Y.; Hidayat; Widenborg, P.I. ; Luther, J. ; Hoex, B. 
92011In-situ X-ray diffraction analysis of the crystallisation of a-SI:H films deposited by the expanding thermal plasma techniqueLaw, F.; Hoex, B. ; Wang, J. ; Luther, J. ; Sharma, K.; Creatore, M.; Van De Sanden, M.C.M.
1031-May-2010Influences of oxygen contamination on evaporated poly-Si thin-film solar cells by solid-phase epitaxyHe, S.; Wong, J.; Inn, D.; Hoex, B. ; Aberle, A.G. ; Sproul, A.B.
117-Jun-2013Integration of β-FeSi2 with poly-Si on glass for thin-film photovoltaic applicationsKumar, A.; Dalapati, G.K.; Hidayat, H.; Law, F.; Tan, H.R.; Widenborg, P.I. ; Hoex, B. ; Tan, C.C.; Chi, D.Z.; Aberle, A.G. 
12Dec-2012Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imagingPeloso, M.P.; Palina, N.; Banas, K. ; Banas, A. ; Hidayat, H.; Hoex, B. ; Breese, M.B.H. ; Aberle, A.G. 
132012Investigation of evaporated rear contacts for Al-LBSF silicon wafer solar cellsChen, J.; Du, Z.; Hoex, B. ; Tey, Z.H.J.; Aberle, A.G. 
142013Investigation of screen-printed rear contacts for aluminum local back surface field silicon wafer solar cellsChen, J.; Tey, Z.H.J.; Du, Z.R.; Lin, F. ; Hoex, B. ; Aberle, A.G. 
1530-Jun-2012Kinetic study of solid phase crystallisation of expanding thermal plasma deposited a-Si:HLaw, F.; Hoex, B. ; Wang, J. ; Luther, J. ; Sharma, K.; Creatore, M.; Van De Sanden, M.C.M.
162013Laser chemical processing (LCP) of poly-silicon thin film on glass substratesVirasawmy, S. ; Palina, N.; Chakraborty, S.; Widenborg, P.I. ; Hoex, B. ; Aberle, A.G. 
172012Line-imaging spectroscopy for characterisation of silicon wafer solar cellsPeloso, M.P.; Lew, J.S.; Hoex, B. ; Aberle, A.G. 
182012Low-temperature surface passivation of moderately doped crystalline silicon by atomic-layer-deposited hafnium oxide filmsLin, F. ; Hoex, B. ; Koh, Y.H.; Lin, J.J. ; Aberle, A.G. 
192013Low-temperature surface passivation of moderately doped crystalline silicon by atomic-layer-deposited hafnium oxide filmsLin, F. ; Hoex, B. ; Koh, Y.H.; Lin, J. ; Aberle, A.G. 
2021-May-2013Medium range order engineering in amorphous silicon thin films for solid phase crystallizationLaw, F.; Widenborg, P.I. ; Luther, J. ; Hoex, B.