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Weng Khuen Ho

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Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
Main Affiliation
 
Faculty
 
Email
elehowk@nus.edu.sg
 

Publications

Results 21-40 of 126 (Search time: 0.016 seconds).

Issue DateTitleAuthor(s)
21Nov-2007Critical dimension uniformity via real-time photoresist thickness controlHo, W.K. ; Tay, A. ; Chen, M.; Fu, J. ; Lu, H.; Shan, X.
22004Detection of Wafer warpages during thermal processing in microlithographyHo, W.K. ; Tay, A. ; Zhou, Y.; Yang, K.; Hu, N.
32012Development of in-situ real-time CD monitoring and control system through PEB processYang, G.; Tay, A. ; Ho, W.K. 
42000Diagnosability of faults using finite-state automaton modelXi, YunXia; Lim, Khiang-Wee ; Ho, Weng-Khuen ; Preisig, Heinz A.
528-Apr-2004Dynamic Principal Component Analysis Based Methodology for Clustering Process States in Agile Chemical PlantsSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
6Dec-2008EditorialQin, S.J.; Hsieh, M.; Epstein, D.J.; Ho, W.K. 
7Dec-2008EditorialQin, S.J.; Hsieh, M.; Epstein, D.J.; Ho, W.K. 
8Jul-2005Estimation of wafer warpage profile during thermal processing in microlithographyTay, A. ; Ho, W.K. ; Hu, N.; Chen, X.
92009Experimental evaluation of multiplexed MPC for semiconductor manufacturingLing, K.V.; Ho, W.K. ; Wu, B.; Aribowo, A.G.; Feng, Y.; Yan, H.
102004Fault detection and estimation of wafer warpage profile during thermal processing in microlithographyTay, A. ; Ho, W.K. ; Hu, N.; Zhou, Y.
112001Fault diagnosis using dynamic finite-state automaton modelsXi, Y.-X.; Lim, K.-W. ; Ho, W.-K. ; Preisig, H.A.
121999Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tablesRamkumar, K.B.; Druckenmueller, M.; Xi, Y.X.; Philips, P.; Presig, H.A.; Ho, W.K. ; Lim, K.W. 
131999Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tablesRamkumar, K.B.; Druckenmueller, M.; Xi, Y.X.; Philips, P.; Presig, H.A.; Ho, W.K. ; Lim, K.W. 
1430-Apr-2014Filtering of the ARMAX process with generalized t -distribution noise: The influence function approachHo, W.K. ; Ling, K.V.; Vu, H.D.; Wang, X.
15Jun-1996Frequency domain approach to self-tuning PID controlHo, W.K. ; Hang, C.C. ; Wojsznis, W.; Tao, Q.H. 
16Jun-1996Frequency domain approach to self-tuning PID controlHo, W.K. ; Hang, C.C. ; Wojsznis, W.; Tao, Q.H. 
172019Full coverage of optimal phasor measurement unit placement solutions in distribution systems using integer linear programmingChen, X.; Sun, L.; Chen, T.; Sun, Y.; Rusli; Tseng, K.J.; Ling, K.V.; Ho, W.K. ; Amaratunga, G.A.J.
181-Feb-1998Gain-scheduling control of the Switched Reluctance MotorHo, W.K. ; Panda, S.K. ; Lim, K.W. ; Huang, F.S.
191-Feb-1998Gain-scheduling control of the Switched Reluctance MotorHo, W.K. ; Panda, S.K. ; Lim, K.W. ; Huang, F.S.
20Jan-1991Generalised minimum-variance stochastic self-tuning controller with pole restrictionHang, C.C. ; Lim, K.W. ; Ho, W.K.