Radhakrishnan, M K

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Full Name

Radhakrishnan, M K

Variants

Radhakrishnan, M.K.

Main Affiliation

INSTITUTE OF MICROELECTRONICS

Faculty

NON-NUS ORGANISATIONS

Refined By:

Subject: Gate dielectric

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		Issue Date	Title	Author(s)
	1	2004	Gate dielectric degradation mechanism associated with DBIE evolution	Pey, K.L.; Ranjan, R.; Tung, C.H.; Tang, L.J.; Lin, W.H.; Radhakrishnan, M.K.