Radhakrishnan, M K

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Full Name

Radhakrishnan, M K

Variants

Radhakrishnan, M.K.

Main Affiliation

INSTITUTE OF MICROELECTRONICS

Faculty

NON-NUS ORGANISATIONS

Refined By:

Subject: Breakdown

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	Issue Date	Title	Author(s)
1	2004	A new breakdown failure mechanism in HfO 2 gate dielectric	Ranjan, R.; Pey, K.L.; Tang, L.J.; Tung, C.H.; Groeseneken, G.; Radhakrishnan, M.K. ; Kaczer, B.; Degraeve, R.; De Gendt, S.
2	2004	Gate dielectric degradation mechanism associated with DBIE evolution	Pey, K.L.; Ranjan, R.; Tung, C.H.; Tang, L.J.; Lin, W.H.; Radhakrishnan, M.K.
3	Mar-2004	Gate Dielectric-Breakdown-Induced Microstructural Damage in MOSFETs	Tang, L.J.; Pey, K.L.; Tung, C.H.; Radhakrishnan, M.K. ; Lin, W.H.