Full Name
Antonio Helio Castro Neto
Variants
Neto Castro, A.H.
Castro Neto, A.H.
Allen, John Carson
Castro-Neto, A.H.
Neto, A.H.C.
Castro Neto, Ant�nio H�lio Elio
Castro Neto, Antonio Helio
ANTONIO HELIO CASTRO NETO
 
 
 
Email
phycastr@nus.edu.sg
 
 

Publications

Refined By:
Type:  Article
Author:  Basov, D.N.

Results 1-6 of 6 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Nov-2013Electronic and plasmonic phenomena at graphene grain boundariesFei, Z.; Rodin, A.S.; Gannett, W.; Dai, S.; Regan, W.; Wagner, M.; Liu, M.K.; McLeod, A.S.; Dominguez, G.; Thiemens, M.; Castro Neto, A.H. ; Keilmann, F.; Zettl, A.; Hillenbrand, R.; Fogler, M.M.; Basov, D.N.
25-Jul-2012Gate-tuning of graphene plasmons revealed by infrared nano-imagingFei, Z.; Rodin, A.S.; Andreev, G.O.; Bao, W.; McLeod, A.S.; Wagner, M.; Zhang, L.M.; Zhao, Z.; Thiemens, M.; Dominguez, G.; Fogler, M.M.; Castro Neto, A.H. ; Lau, C.N.; Keilmann, F.; Basov, D.N.
39-Nov-2011Infrared nanoscopy of dirac plasmons at the graphene-SiO2 interfaceFei, Z.; Andreev, G.O.; Bao, W.; Zhang, L.M.; S. McLeod, A.; Wang, C.; Stewart, M.K.; Zhao, Z.; Dominguez, G.; Thiemens, M.; Fogler, M.M.; Tauber, M.J.; Castro-Neto, A.H. ; Lau, C.N.; Keilmann, F.; Basov, D.N.
421-Feb-2012Near-field spectroscopy of silicon dioxide thin filmsZhang, L.M.; Andreev, G.O.; Fei, Z.; McLeod, A.S.; Dominguez, G.; Thiemens, M.; Castro-Neto, A.H. ; Basov, D.N.; Fogler, M.M.
52014Tunable phonon polaritons in atomically thin van der Waals crystals of boron nitrideDai, S.; Fei, Z.; Ma, Q.; Rodin, A.S.; Wagner, M.; McLeod, A.S.; Liu, M.K.; Gannett, W.; Regan, W.; Watanabe, K.; Taniguchi, T.; Thiemens, M.; Dominguez, G.; Castro Neto, A.H. ; Zettl, A.; Keilmann, F.; Jarillo-Herrero, P.; Fogler, M.M.; Basov, D.N.
612-Feb-2014Ultrafast and nanoscale plasmonic phenomena in exfoliated graphene revealed by infrared pump-probe nanoscopyWagner, M.; Fei, Z.; McLeod, A.S.; Rodin, A.S.; Bao, W.; Iwinski, E.G.; Zhao, Z.; Goldflam, M.; Liu, M.; Dominguez, G.; Thiemens, M.; Fogler, M.M.; Castro Neto, A.H. ; Lau, C.N.; Amarie, S.; Keilmann, F.; Basov, D.N.