Organization name
ELECTRICAL & COMPUTER ENGINEERING


Results 1-20 of 12580 (Search time: 0.017 seconds).

Issue DateTitleAuthor(s)
12006ZnO nanoparticles beaded multiwalled carbon nanotubesZhu, Y. ; Elim, H.I. ; Foo, Y.L.; Triparthy, S.; Quek, W.T.; Ji, W. ; Thong, J. ; Sow, C.H. 
22006ZnO homojunctions grown by cosputtering ZnO and Zn3P 2 targetsHu, G. ; Gong, H. ; Chor, E.F. ; Wu, P.
323-Apr-2012ZnO coaxial nanorod homojunction UV light-emitting diodes prepared by aqueous solution methodNguyen, X.S.; Tay, C.B. ; Fitzgerald, E.A.; Chua, S.J. 
42002Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanismsNg, T.H.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.
52006Zinc-blende structure of CrTe epilayers grown on GaAsSreenivasan, M.; Teo, K. ; Du, A.; Jalil, M. ; Liew, T.
621-May-2012ZINC OXIDE-BASED THIN FILM ELECTRONICSWONG LAI MUN
72013Zero-phase-shift line antennasQing, X.; Chen, Z.N. ; Shi, J.; Goh, C.K.
82011Zero modes & fractional charge in bilayer grapheneMartinez, J.C. ; Jalil, M.B.A. ; Tan, S.G. 
92010Zero Correlation Zone Codes and Extended Zero Correlation Zone Codes for MIMO radar signal separationMa, C. ; Yeo, T.S. ; Guo, Q.; Tan, C.S.; Wei, P.; Xu, G.
10Jun-2007Yttrium- and terbium-based interlayer on SiO2 and HfO2 gate dielectrics for work function modulation of nickel fully silicided gate in nMOSFETLim, A.E.-J.; Lee, R.T.P. ; Wang, X.P.; Hwang, W.S.; Tung, C.H.; Samudra, G.S. ; Kwong, D.-L.; Yeo, Y.-C. 
112003Yellow luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescenceTeo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.S.; Chua, S.J. ; Liu, Y.Y. 
12Mar-2006Yb-doped Ni FUSI for the n-MOSFETs gate electrode applicationChen, J.D. ; Yu, H.Y.; Li, M.F. ; Kwong, D.-L.; van Dal, M.J.H.; Kittl, J.A.; Lauwers, A.; Absil, P.; Jurczak, M.; Biesemans, S.
1320-Jan-2014Y-shape spin-separator for two-dimensional group-IV nanoribbons based on quantum spin hall effectGupta, G.; Lin, H.; Bansil, A.; Abdul Jalil, M.B. ; Huang, C.-Y.; Tsai, W.-F.; Liang, G. 
142013XOXO: Haptic interface for mediated intimacySamani, H.; Teh, J.; Saadatian, E.; Nakatsu, R. 
15Nov-2001X-ray photoemission spectroscopy study of silicidation of Ti on BF2 +-implanted polysiliconChua, H.N.; Pey, K.L. ; Lai, W.H.; Chai, J.W.; Pan, J.S.; Chua, D.H.C.; Siah, S.Y.
162001X-ray photoelectron spectroscopic study of InGaAsN grown by MOCVDChang, W.; Lin, J. ; Zhou, W.; Chua, S.J. ; Liu, Y.J. ; Wee, A.T.S. 
172002X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium filmsLeoy, C.C.; Choi, W.K. ; Wong, K.L. ; Wong, K.M. ; Osipowicz, T. ; Rong, J.
182012Writing process induced media noise measurementAng, S.; Ong, C.L.; Yuan, Z.; Pang, C.K. 
192007WPAR: A weight-based metadata management strategy for petabyte-scale object storage systemsLin, W.; Wei, Q.; Veeravalli, B. 
202013Wow You are so beautiful todayLiu, L.; Xu, H.; Xing, J.; Liu, S. ; Zhou, X.; Yan, S.