Organization name
SINGAPORE SYNCHROTRON LIGHT SOURCE


Results 1-20 of 381 (Search time: 0.008 seconds).

Issue DateTitleAuthor(s)
1Feb-2012Zinc in prostate cancer: The study based on synchrotron radiation techniquesBanas, A. ; Banas, K. ; Kwiatek, W.M.; Gajdac, M.; Pawlickid, B.; Cichockic, T.
21-May-2015XAFCA: A new XAFS beamline for catalysis researchDu, Y.; Xi, S.; Yang, Ping ; Moser, Herbert Oskar ; Breese, Mark B.H. ; Borgna, A 
32007X-ray-based micro/nanomanufacturing at SSLS - Technology and applicationsJian, L.K. ; Casse, B.D.F. ; Heussler, S.P. ; Kong, J.R. ; Moser, H.O. ; Ren, Y.P.; Saw, B.T. ; Bin Mahmood, S. 
42015X-ray lithography of SU8 photoresist using fast miniature plasma focus device and its characterization using FTIR spectroscopyKalaiselvi, Shenbaga M. P.; Tan, Augustine Tuck Lee; Talebitaher, Alireza R.; Lee, Paul; Heussler, Sascha Pierre ; Breese, Mark Brian H. ; Rawat, Rajdeepsingh
521-Feb-2008Water-induced negative electron affinity on diamond (100)Gao, X. ; Liu, L. ; Qi, D. ; Chen, S. ; Wee, A.T.S. ; Ouyang, T.; Loh, K.P. ; Yu, X. ; Moser, H.O. 
6Apr-2009Wafer-level BCB bonding using a thermal press for microfluidicsZhou, X.; Virasawmy, S. ; Quan, C. 
718-Jun-2021Wafer Scale Manufacturing of High Precision Micro-Optical Components through X-Ray Lithography yielding 1800 Gray Levels in a Fingertip Sized ChipKalaiselvi, Shenbaga Manogara Pandian ; Xiaosong, Eric Tang; Oskar, Herbert Moser; B.H., Mark Breese ; Turaga, Shuvan Prashant; Kasi, Harsha; Heussler, Sascha Pierre
82017Very efficient spin polarization analysis (VESPA): New exchange scattering-based setup for spin-resolved ARPES at APE-NFFA beamline at ElettraBigi, C; Das, P.K ; Benedetti, D; Salvador, F; Krizmancic, D; Sergo, R; Martin, A; Panaccione, G; Rossi, G; Fujii, J; Vobornik, I
9Jun-2000Use of the track structure approach in TEMBourdillon, A.J. 
102015Use of precisely sculptured thin film (STF) substrates with generalized ellipsometry to determine spatial distribution of adsorbed fibronectin to nanostructured columnar topographies and effect on cell adhesionKasputis, Tadas; Pieper, Alex; Rodenhausen, Keith Brian Rian; Schmidt, Daniel R. ; Sekora, Derek G.; Rice, Charles; Schubert, Eva; Schubert, Mathias M.; Pannier, Angela Kaye
1115-Apr-2011Use of a line focus of a quadrupole multiplet for irradiating millimeter length linesXiong, B.Q.; Breese, M.B.H. ; Azimi, S.; Ow, Y.S. ; Teo, E.J. 
122015Unraveling how electronic and spin structures control macroscopic properties of manganite ultra-thin filmsYin, X ; Majidi, M.A ; Chi, X ; Ren, P; You, L; Palina, N; Yu, X ; Diao, C ; Schmidt, D ; Wang, B; Yang, P ; Breese, M.B.H ; Wang, J; Rusydi, A 
13Feb-2014Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometryYang, P. ; Liu, H.; Chen, Z.; Chen, L.; Wang, J. 
146-Jun-2013Uniaxial strain-induced ferroelectric phase with a giant axial ratio in a (110) BiFeO3 thin filmLiu, H.; Yang, P. ; Fan, Z.; Kumar, A.; Yao, K.; Ong, K.P.; Zeng, K. ; Wang, J. 
157-May-2002Ultra high resolution lithographic imaging and printing and defect reduction by exposure near the critical condition utilizing fresnel diffractionVLADIMIRSKY, YULI ; BOURDILLON, ANTONY 
163-Jul-2002ULTRA HIGH RESOLUTION LITHOGRAPHIC IMAGING AND PRINTING AND DEFECT REDUCTION BY EXPOSURE NEAR THE CRITICAL CONDITIONVLADIMIRSKY, YULI ; BOURDILLON, ANTONY 
178-Mar-2001ULTRA HIGH RESOLUTION LITHOGRAPHIC IMAGING AND PRINTING AND DEFECT REDUCTION BY EXPOSURE NEAR THE CRITICAL CONDITIONVLADIMIRSKY, YULI ; BOURDILLON, ANTONY 
188-Mar-2001ULTRA HIGH RESOLUTION LITHOGRAPHIC IMAGING AND PRINTING AND DEFECT REDUCTION BY EXPOSURE NEAR THE CRITICAL CONDITIONVLADIMIRSKY, YULI ; BOURDILLON, ANTONY 
192010Twinning rotation and ferroelectric behavior of epitaxial BiFeO3 (001) thin filmLiu, H.; Yang, P. ; Yao, K.; Wang, J. 
2023-Dec-2013Tuning the Interface Conductivity of LaAlO3/SrTiO3 Using Ion Beams: Implications for PatterningMathew, S. ; Annadi, A.; Chan, T.K. ; Asmara, T.C.; Zhan, D.; Wang, X.R.; Azimi, S.; Shen, Z.; Rusydi, A. ; Ariando; Breese, M.B.H. ; Venkatesan, T.