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Showing results 493 to 493 of 493 < previous 
Issue DateTitleAuthor(s)
2002X-ray diffraction and Raman studies of rf sputtered polycrystalline silicon germanium filmsLeoy, C.C.; Choi, W.K. ; Wong, K.L. ; Wong, K.M. ; Osipowicz, T. ; Rong, J.