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Issue DateTitleAuthor(s)
Dec-2004An investigation of structure, magnetic properties and magnetoresistance of Ni films prepared by sputteringYi, J.B. ; Zhou, Y.Z.; Ding, J. ; Chow, G.M. ; Dong, Z.L.; White, T.; Gao, X. ; Wee, A.T.S. ; Yu, X.J. 
5-May-1998An ultrafine barium ferrite powder of high coercivity from water-in-oil microemulsionLiu, X.; Wang, J. ; Gan, L.-M. ; Ng, S.-C. ; Ding, J. 
1997Analysis of coatings which inhibit epoxy bleeding in electronic packagingTan, N.X.; Lim, K.H.H.; Bourdillon, A.J. 
1-Apr-2004Analysis of nanoindentation creep for polymeric materialsYang, S.; Zhang, Y.-W. ; Zeng, K.
Sep-2000Analysis of triple Co alloy layer magnetic thin films with different bias configurationJin, D.; Wang, J.P.; Gong, H. 
1-Apr-2012Angular dependence and temperature effect on switching field distribution of Co/Pd based bit patterned mediaLi, W.M. ; Huang, X.L.; Shi, J.Z.; Chen, Y.J.; Huang, T.L.; Ding, J. 
3-Mar-1998Anisothermal oxidation of micro-crystalline Ni-20Cr-5Al alloy coating at 850-1280°CLiu, Z.; Gao, W.; Gong, H. 
Jul-2001Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuumsLiu, L. ; Wang, Y. ; Gong, H. 
20-Oct-2001Annealing effects of tantalum thin films sputtered on [001] silicon substrateLiu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R. 
20-Jan-2002Annealing effects on contact properties of Aluminum doped Zinc Oxide thin filmsLow, K.B.; Gong, H. ; Chor, E.F. 
Jan-2002Anomalous electroless polyol deposition of FeNi powders and filmsYin, H.; Chow, G.M. 
Dec-1999Anomalous magnetic viscosity in bulk-amorphous materialsWang, L.; Ding, J. ; Li, Y. ; Feng, Y.P. ; Wang, X.Z. 
2002Anomalous x-ray scattering for determination of nanostructured alloy formation and site-specific chemistry of Bragg peakChow, G.M. 
1998Application of a negative sweep voltage to control gate of fresh flash memory devices to facilitate threshold voltage test measurementCha, C.L.; Chor, E.F. ; Gong, H. ; Teo, T.H.; Zhang, A.Q.; Chan, L.
15-Feb-2004Application of the tight-binding method to the elastic modulus of C60 and carbon nanotubeCai, J. ; Bie, R.F.; Tan, X.M.; Lu, C.
Mar-2003Applications of micro-Raman spectroscopy in salicide characterization for Si device fabricationZhao, F.F.; Chen, S.Y.; Shen, Z.X. ; Gao, X.S. ; Zheng, J.Z.; See, A.K.; Chan, L.H.
12-Jan-2004Atomic layer deposited hafnium-based gate dielectrics for deep sub-micron CMOS technologyHO MUN YEE
2000Atomistic modeling and simulationPhilpott, M.R. 
15-Sep-2005Atomistic simulations of formation and stability of carbon nanoringsLiu, P.; Zhang, Y.W. ; Lu, C.
1-Jun-2006Atomistic simulations of the mechanical properties of nanocrystalline copper at room temperatureZHENG CHEN