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Zheng, J.X.
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Showing results 1 to 8 of 8
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Issue Date
Title
Author(s)
14-Mar-2007
First-principles study of native point defects in hafnia and zirconia
Zheng, J.X.
;
Ceder, G.
;
Maxisch, T.
;
Chim, W.K.
;
Choi, W.K.
Oct-2008
First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials
Zheng, J.X.
;
Ceder, G.
;
Chim, W.K.
15-Apr-2003
Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanisms
Chim, W.K.
;
Ng, T.H.
;
Koh, B.H.
;
Choi, W.K.
;
Zheng, J.X.
;
Tung, C.H.
;
Du, A.Y.
15-Oct-2003
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide
Chim, W.K.
;
Zheng, J.X.
;
Koh, B.H.
2006
Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study
Zheng, J.X.
;
Ceder, G.
;
Maxisch, T.
;
Chim, W.K.
;
Choi, W.K.
2002
Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric
Koh, B.H.
;
Ng, T.H.
;
Zheng, J.X.
;
Chim, W.K.
;
Choi, W.K.
1-May-2004
Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory application
Koh, B.H.
;
Chim, W.K.
;
Ng, T.H.
;
Zheng, J.X.
;
Choi, W.K.
2002
Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanisms
Ng, T.H.
;
Koh, B.H.
;
Chim, W.K.
;
Choi, W.K.
;
Zheng, J.X.
;
Tung, C.H.
;
Du, A.Y.