Browsing by Author Zheng, J.X.

Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
14-Mar-2007First-principles study of native point defects in hafnia and zirconiaZheng, J.X.; Ceder, G.; Maxisch, T.; Chim, W.K. ; Choi, W.K. 
Oct-2008First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materialsZheng, J.X.; Ceder, G.; Chim, W.K. 
15-Apr-2003Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanismsChim, W.K. ; Ng, T.H.; Koh, B.H.; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.
15-Oct-2003Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxideChim, W.K. ; Zheng, J.X.; Koh, B.H.
2006Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles studyZheng, J.X.; Ceder, G.; Maxisch, T.; Chim, W.K. ; Choi, W.K. 
2002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
1-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
2002Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanismsNg, T.H.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.