Browsing by Author Zhang, B.C.

Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
15-Oct-2004Characterization of HfO2/Si(0 0 1) interface with high-resolution rutherford backscattering spectroscopyNakajima, K.; Joumori, S.; Suzuki, M.; Kimura, K.; Osipowicz, T. ; Tok, K.L.; Zheng, J.Z.; See, A.; Zhang, B.C.
5-Dec-2002Cool copper template for the formation of oriented nanocrystalline α-tantalumYong, C.; Zhang, B.C.; Seet, C.S.; See, A.; Chan, L.; Sudijono, J.; Liew, S.L.; Tung, C.-H.; Zeng, H.C. 
Aug-2003Effects of first rapid thermal annealing temperature on Co silicide formationPeng, H.J.; Shen, Z.X. ; Lim, E.H.; Lai, C.W.; Liu, R. ; Wee, A.T.S. ; Sameer, A.; Dai, J.Y.; Zhang, B.C.; Zheng, J.Z.
2004Quantifying adhesion strength for Cu/Ta barriers/FTEOS dielectric using modified edge lift off testHo, C.S.; Yong, C.; Zhang, B.C.; Lim, C.Y.H. 
14-Jul-2003Strain profiling of HfO2/Si(001) interface with high-resolution Rutherford backscattering spectroscopyNakajima, K.; Joumori, S.; Suzuki, M.; Kimura, K.; Osipowicz, T. ; Tok, K.L.; Zheng, J.Z.; See, A.; Zhang, B.C.
2004Uniform void-free epitaxial CoSi 2 formation on STI bounded narrow Si(lOO) lines by template layer stress reductionHo, C.S.; Pey, K.L.; Tung, C.H.; Zhang, B.C.; Tee, K.C.; Karunasiri, G. ; Chua, S.J. 
Dec-2003Via resistance reduction using "cool" PVD-Ta processingSeet, C.S.; Zhang, B.C.; Yong, C.; Liew, S.L.; Li, K.; Hsia, L.C.; Seng, H.L. ; Osiposwicz, T. ; Sudijono, J.; Zeng, H.C. ; Tan, J.B.