Browsing by Author Yang, C.Y.

Showing results 1 to 9 of 9
Issue DateTitleAuthor(s)
20-Nov-2002C-V and DLTS characterization of rapid thermal oxides on Si0.887Ge0.113 and Si0.8811Ge0.113C0.0059 alloysFeng, W.; Choi, W.K. ; Bera, L.K. ; Mi, J.; Yang, C.Y.
2006Carbon nanostructures as interconnect and interface materialsDe Asis, E.; Ngo, Q.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
2006Carbon nanotube interconnects in electrical and biological systemsNgo, Q.; De Asis, E.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
2007Carbon-based nanostructures as interconnects in electrical and biological systemsDe Asis, E.; Ngo, Q.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
10-Jul-2000Electrical properties of rapid thermal oxides on Si1-x-yGexCy filmsBera, L.K. ; Choi, W.K. ; Feng, W.; Yang, C.Y.; Mi, J.
Dec-2001Optical characterization of as-prepared and rapid thermal oxidized partially strain compensated Si1-x-y GexCy filmsFeng, W.; Choi, W.K. ; Bera, L.K. ; Ji, M.; Yang, C.Y.
Dec-2001Spectroscopic ellipsometry and electrical studies of as-grown and rapid thermal oxidized Si1-x-yGexCy filmsChoi, W.K. ; Feng, W.; Bera, L.K. ; Yang, C.Y.; Mi, J.
1-Jan-2000Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor depositionChoi, W.K. ; Chen, J.H. ; Bera, L.K. ; Feng, W.; Pey, K.L. ; Mi, J.; Yang, C.Y.; Ramam, A. ; Chua, S.J. ; Pan, J.S. ; Wee, A.T.S. ; Liu, R. 
1-Jun-2000Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy filmsChoi, W.K. ; Bera, L.K. ; Chen, J.H. ; Feng, W.; Pey, K.L. ; Yoong, H.; Mi, J.; Zhang, F.; Yang, C.Y.