Browsing by Author Street, A.G.

Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
2011Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning techniqueMeng, L.; Steen, S.; Koo, C.K. ; Bhatia, C.S. ; Street, A.G.; Joshi, P.; Kim, Y.H.; Phang, J.C.H. 
Sep-2011Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced currentMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
2012Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Rao, S.S.P.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H. 
2013Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopyMeng, L.; Papa Rao, S.S.; Bhatia, C.S. ; Steen, S.E.; Street, A.G.; Phang, J.C.H. 
2005Novel acoustic techniques for microelectronic failure analysis and characterizationWong, W.K. ; Street, A.G.
2010SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cellsMeng, L.; Nagalingam, D. ; Bhatia, C.S. ; Street, A.G.; Phang, J.C.H. 
2013Single contact electron beam induced current technique for solar cell characterizationMeng, L.; Street, A.G.; Phang, J.C.H. ; Bhatia, C.S. 
2009Subsurface imaging of multi-level integrated circuits using scanning electron acoustic microscopyMeng, L.; Street, A.G.; Phang, J.C.H.