Browsing by Author See, K.S.

Showing results 1 to 1 of 1
Issue DateTitleAuthor(s)
2005High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devicesToh, S.L.; Loh, K.P. ; See, K.S.; Boothroyd, C.B.; Li, K.; Lau, W.S.; Ang, C.H.; Chan, L.