Browsing by Author Sanchez, J.L.

Showing results 1 to 19 of 19
Issue DateTitleAuthor(s)
Mar-1998A high resolution beam scanning system for deep ion beam lithographySanchez, J.L.; Van Kan, J.A. ; Osipowicz, T. ; Springham, S.V.; Watt, F. 
1997Deep ion beam lithography for micromachining applicationsSpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Lee, S.; Watt, F. 
1997Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysisOsipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
Mar-1998Fluence dependence of IBIC collection efficiency of CMOS transistorsOsipowicz, T. ; Sanchez, J.L.; Orlic, I. ; Watt, F. ; Kolachina, S.; Chan, D.S.H. ; Phang, J.C.H. 
1997Ion Beam Induced Charge imaging for the failure analysis of semiconductor devicesKolachina, S.; Chan, D.S.H. ; Phang, J.C.H. ; Osipowicz, T. ; Sanchez, J.L.; Watt, F. 
Jul-1997Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in MyanmarSanchez, J.L.; Osipowicz, T. ; Tang, S.M. ; Tay, T.S.; Win, T.T.
Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F. 
1999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
Jul-1997Nuclear microscopy study of fish scalesTang, S.M. ; Orlic, I. ; Yu, K.N.; Sanchez, J.L.; Thong, P.S.P. ; Watt, F. ; Khoo, H.W. 
2-Apr-1999Parametrization of the total photon mass attenuation coefficients for photon energies between 100 eV and 1000 MeVOrlić, I. ; Bogdanović, I.; Zhou, S. ; Sanchez, J.L.
2-Sep-1999Proton micromachining of substrate scaffolds for cellular and tissue engineeringSanchez, J.L.; Guy, G. ; Van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
Feb-2000Proton micromachining: A new technique for the production of three-dimensional microstructuresVan Kan, J.A. ; Sanchez, J.L.; Osipowicz, T. ; Watt, F. 
2-Apr-1999Quantitative analysis of cascade impactor samples - revisitedOrlić, I. ; Chiam, S.Y. ; Sanchez, J.L.; Tang, S.M. 
Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
2-Sep-1999Resist materials for proton micromachiningVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
2000The use of proton microbeams for the production of microcomponentsOsipowicz, T. ; Van Kan, J.A. ; Sum, T.C. ; Sanchez, J.L.; Watt, F. 
Jul-1997TTPIXAN - The 4th generationOrlić, I. ; Loh, K.K. ; Liew, S.C. ; Ng, Y.K.; Sanchez, J.L.; Tang, S.M. 
2-Sep-1999VIBA-LAB2: A virtual ion beam analysis laboratory software package incorporating elemental map simulationsZhou, S.J. ; Orlic, I. ; Sanchez, J.L.; Watt, F. 
2-Apr-1999Virtual PIXE and RBS laboratoryOrlic, I. ; Zhou, S. ; Sanchez, J.L.; Watt, F. ; Tang, S.M.