Browsing by Author Rusli

Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
20-Mar-2002Characteristics of CVD diamond films in detecting UV, x-ray and alpha particleAhn, J.; Gan, B.; Zhang, Q.; Rusli; Yoon, S.F.; Ligatchev, V.; Wang, S.-G.; Huang, Q.-F.; Chew, K.; Patran, A.-C.; Serban, A.; Liu, M.-H.; Lee, S.; Bettiol, A.A. ; Osipowicz, T. ; Watt, F. 
Mar-2002Characteristics of nickel-containing carbon films deposited using electron cyclotron resonance CVDHuang, Q.F.; Yoon, S.F.; Rusli; Zhang, Q.; Ahn, J.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
26-Feb-1999Deposition of polymeric nitrogenated amorphous carbon films (a-C:H:N) using electron cyclotron resonance CVDYoon, S.F.; Rusli; Ahn, J.; Zhang, Q.; Yang, C.Y. ; Yang, H.; Watt, F. 
Jun-2001Effect of radio-frequency bias voltage on the optical and structural properties of hydrogenated amorphous silicon carbideCui, J.; Rusli; Yoon, S.F.; Teo, E.J. ; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Osipowicz, T. ; Watt, F. 
Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
1-Apr-2002Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopyChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Zhang, Q.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
1-Sep-2002Hydrogenated amorphous silicon carbide deposition using electron cyclotron resonance chemical vapor deposition under high microwave power and strong hydrogen dilutionChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
18-May-2001Investigation of Ge nanocrystal formation in SiO2-Ge-SiO2 sandwich structureChoi, W.K. ; Ng, V. ; Swee, V.S.L.; Ong, C.S.; Yu, M.B.; Rusli; Yoon, S.F.
Sep-2000Investigation of molybdenum-carbon films (Mo-C:H) deposited using an electron cyclotron resonance chemical vapor deposition systemRusli; Yoon, S.F.; Huang, Q.F.; Yang, H.; Yu, M.B.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
1-Nov-1999Investigation of tungsten incorporated amorphous carbon filmRusli; Yoon, S.F.; Yang, H.; Ahn, J.; Huang, Q.F.; Zhang, Q.; Guo, Y.P. ; Yang, C.Y. ; Teo, E.J. ; Wee, A.T.S. ; Huan, A.C.H. 
20-Oct-2001Raman and photoluminescence characterization of Ge nanocrystals in co-sputtered Ge + SiO2 systemChoi, W.K ; Ng, V. ; Ho, Y.W; Ng, S.P; Chen, T.B; Yu, M.B; Rusli; Yoon, S.F; Cheong, B.A; Chen, G.L
Nov-1998The effects of nitrogen flow on the Raman spectra of polycrystalline diamond filmsZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Guo, Y.-P. 
May-1993Theoretical analysis of bound-to-continum state infrared absorption in GaAs/AlxGa1-x as quantum wall structuresRusli; Tow Chong, Chong ; Soo Jin, Chua 
24-Jan-2000Tungsten-carbon thin films deposited using screen grid technique in an electron cyclotron resonance chemical vapour deposition systemRusli; Yoon, S.F.; Yang, H.; Ahn, J.; Huang, Q.F.; Zhang, Q.; Guo, Y.P. ; Yang, C.Y. ; Teo, E.J. ; Wee, A.T.S. ; Huan, A.C.H. ; Watt, F.