Browsing by Author Ong, K.H.

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
Nov-1997A robust focusing and astigmatism correction method for the scanning electron microscopeOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Jun-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing methodOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Aug-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved techniqueOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
2004Clinico-pathological analysis of myelodysplastic syndromes according to French-American-British classification and international prognostic scoring systemLau, L.G.; Chng, W.J.; Liu, T.C.; Tan, L.K. ; Ong, K.H.; Mow, B.M.F.; Kueh, Y.K. 
Sep-2011Hereditary thrombophilia in an unselected cohort of venous thrombosis patients in SingaporeLee, L.H.; Liu, T.C. ; Kuperan, P.; Tan, L.K. ; Tan, D.; Poon, M.L.; Ong, K.H.; Fong, S.Z.; Tan, M.Y.; Ng, H.J.
2-Jan-2007Influence of particle wall adhesion on particle electrification in mixersZhu, K.; Tan, R.B.H. ; Chen, F.; Ong, K.H.; Heng, P.W.S. 
Dec-2009Molecular epidemiology of vancomycin-resistant enterococci in SingaporeKoh, T.H.; Low, B.S.; Leo, N.; Hsu, L.-Y. ; Lin, R.T.P.; Krishnan, P.; Chan, D.; Nadarajah, M.; Toh, S.L.; Ong, K.H.
Oct-2001Practical issues on the detection of damage in beams using waveletsQuek, S.T. ; Wang, Q. ; Zhang, L.; Ong, K.H.
Aug-2012The impact of frontline risk-adapted strategy on the overall survival of patients with newly diagnosed multiple myeloma: An analysis of the Singapore multiple myeloma study groupTan, D.; Ong, K.H.; Koh, L.P.; Wong, S.S.; Khin, M.T.; Lee, L.H.; Goh, Y.T.; Chng, W.J. 
Sep-2013The impact of upfront versus sequential use of bortezomib among patients with newly diagnosed multiple myeloma (MM): A joint analysis of the Singapore MM Study Group and the Korean MM Working Party for the Asian myeloma networkTan, D.; Kim, K.; Kim, J.S.; Eom, H.-S.; Teoh, G.; Ong, K.H.; Goh, Y.T.; Durie, B.G.M.; Chng, W.J. ; Lee, J.H.