Browsing by Author Ng, T.H.

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Issue DateTitleAuthor(s)
Nov-2005A memory efficient testing scheme for combined field integral equation for solving scattering problems using adaptive integral methodNg, T.H.; Ooi, B.L. ; Kooi, P.S. 
1-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
20-Sep-2004Clarifying the origin of near-infrared electroluminescence peaks for nanocrystalline germanium in metal-insulator-silicon structuresKan, E.W.H.; Chim, W.K. ; Lee, C.H.; Choi, W.K. ; Ng, T.H.
2006Conductance-voltage measurements on germanium nanocrystal memory structures and effect of gate electric field couplingNg, T.H.; Chim, W.K. ; Choi, W.K. 
Sep-2004Fabrication and characterization of a trilayer germanium nanocrystal memory device with hafnium dioxide as the tunnel dielectricNg, T.H.; Ho, V.; Teo, L.W.; Tay, M.S.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Du, A.Y.; Tung, C.H.
Jan-2010Forest fragment and breeding habitat characteristics explain frog diversity and abundance in SingaporeBickford, D. ; Ng, T.H.; Qie, L.; Kudavidanage, E.P.; Bradshaw, C.J.A.
1999High efficiency power amplifier design using a simplified approachNg, T.H.; Ooi, B.L. ; Leong, M.S. ; Ma, J.Y.; Ong, H.S.; Chew, S.T. 
1999High efficiency power amplifier design using a simplified approachNg, T.H.; Ooi, B.L. ; Leong, M.S. ; Ma, J.Y.; Ong, H.S.; Chew, S.T. 
2004High-K HfAlO charge trapping layer in SONOS-type nonvolatile memory device for high speed operationTan, Y.N.; Chim, W.K. ; Choi, W.K. ; Joo, M.S. ; Ng, T.H.; Cho, B.J. 
10-May-2006High-thermal-stability (HfO2)1-x(Al2O 3)x film fabricated by dual-beam laser ablationLi, Q.; Wang, S.J.; Ng, T.H.; Chim, W.K. ; Huan, A.C.H.; Ong, C.K. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
15-Apr-2003Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanismsChim, W.K. ; Ng, T.H.; Koh, B.H.; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.
31-May-2004Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectricNg, T.H.; Chim, W.K. ; Choi, W.K. ; Ho, V.; Teo, L.W.; Du, A.Y.; Tung, C.H.
5-Oct-2000Non-Galerkin method of computing the dispersion characteristic of microstrip lines using spectral-domain analysisNg, T.H.; Ooi, B.L. ; Kooi, P.S. 
5-Oct-2000Non-Galerkin method of computing the dispersion characteristic of microstrip lines using spectral-domain analysisNg, T.H.; Ooi, B.L. ; Kooi, P.S. 
2000Optimization of surface micromachined patch antennaWong, S.; Ooi, B.L. ; Kooi, P.S. ; Ng, T.H.; Liu, A.Q.
2000Optimization of surface micromachined patch antennaWong, S.; Ooi, B.L. ; Kooi, P.S. ; Ng, T.H.; Liu, A.Q.
2002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
1-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K.