Browsing by Author Ng, R.J

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Issue DateTitleAuthor(s)
2017Impact and Origin of Interface States in MOS Capacitor with Monolayer MoS 2 and HfO 2 High-k DielectricXia, P; Feng, X ; Ng, R.J; Wang, S ; Chi, D; Li, C; He, Z; Liu, X; Ang, K.-W