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| Issue Date | Title | Author(s) |
| Jun-1995 | An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes | Pey, K.L.; Chim, W.K. ; Koh, L.S.; Liu, Y.Y.; Chew, S.Y.C. |
| 1997 | Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| 1-Mar-2000 | Can physical analysis aid in device characterization? | Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H. |
| 1998 | Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiency | Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X. |
| 1996 | Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor | Wittpahl, V.; Liu, Y.Y.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J.; Yan, K.P. |
| Jul-1996 | Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices | Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. |
| 1996 | High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| 1996 | High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| 1999 | Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis | Ng, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. |
| 1999 | Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis | Ng, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. |
| Oct-2004 | Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics | Chan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V. |
| 1995 | New spectroscopic photon emission microscope system for semiconductor device analysis | Liu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. |
| 1995 | New spectroscopic photon emission microscope system for semiconductor device analysis | Liu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. |
| 1999 | Study on LED degradation using CL, EBIC and a two-diode parameter extraction model | Xiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P. |
