Browsing by Author Liu, Y.Y.

Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
Jun-1995An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodesPey, K.L.; Chim, W.K. ; Koh, L.S.; Liu, Y.Y.; Chew, S.Y.C. 
1997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
1-Mar-2000Can physical analysis aid in device characterization?Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Liu, Y.Y.; Ng, T.H.; Xiao, H.
1998Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiencyPhang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Liu, Y.Y.; Liu, X.
1996Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factorWittpahl, V.; Liu, Y.Y.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J.; Yan, K.P.
Jul-1996Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devicesChan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. 
1996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
1996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
Oct-2004Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror opticsChan, D.S.H. ; Liu, Y.Y.; Phang, J.C.H. ; Rau, E.; Sennov, R.; Gostev, A.V.
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1999Study on LED degradation using CL, EBIC and a two-diode parameter extraction modelXiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P.