Browsing by Author Liu, W.J.

Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
Mar-2011A high-yield HfOx-based unipolar resistive ram employing Ni electrode compatible with Si-diode selector for crossbar integrationTran, X.A.; Yu, H.Y.; Yeo, Y.C. ; Wu, L.; Liu, W.J.; Wang, Z.R.; Fang, Z.; Pey, K.L.; Sun, X.W.; Du, A.Y.; Nguyen, B.Y.; Li, M.F.
2009A modified charge-pumping method for the cxharacterization of interface-trap generation in MOSFETsHuang, D.; Liu, W.J.; Liu, Z.Y.; Liao, C.C.; Zhang, L.-F.; Gan, Z.; Wong, W.; Li, M.-F. 
2012A self-rectifying alo y bipolar RRAM with sub-50μA set/reset current for cross-bar architectureTran, X.A.; Zhu, W.; Liu, W.J.; Yeo, Y.C. ; Nguyen, B.Y.; Yu, H.Y.
Apr-2012A self-rectifying HfO x-based unipolar RRAM with Nisi electrodeTran, X.A.; Zhu, W.G.; Gao, B.; Kang, J.F.; Liu, W.J.; Fang, Z.; Wang, Z.R.; Yeo, Y.C. ; Nguyen, B.Y.; Li, M.F.; Yu, H.Y.
2010Automatic ontology construction for manufacturing knowledge and information managementHou, X.; Liu, W.J.; Ong, S.K. ; Nee, A.Y.C. 
2008Characteristics of NBTI in pMOSFETs with thermally and plasma nitrided gate oxidesLiu, W.J.; Liu, Z.Y.; Luo, Y.; Jiao, G.F.; Huang, X.Y.; Huang, D.; Liao, C.C.; Zhang, L.F.; Gan, Z.H.; Wong, W.; Li, M.-F. 
2008Comprehensive studies of BTI effects in CMOSFETs with SiON by new measurement techniquesLiu, Z.Y.; Huang, D.; Liu, W.J.; Liao, C.C.; Zhang, L.F.; Gan, Z.H.; Wong, W.; Li, M.-F. 
Sep-2011GRAONTO: A graph-based approach for automatic construction of domain ontologyHou, X.; Ong, S.K. ; Nee, A.Y.C. ; Zhang, X.T.; Liu, W.J.
1-Jul-2003Mutagenicity of polluted reservoir water and its reduction by a pilot-scale integrated biological treatment processHu, J.Y. ; Ong, S.L. ; Ng, W.J. ; He, B.P.; Liu, W.J.; Fang, Z.D.; Zhang, X.H.; Wang, Z.S.
2009New insights of BTI degradation in MOSFETs with SiON gate dielectricsLi, M.-F. ; Huang, D.; Liu, W.J.; Liu, Z.Y.; Huang, X.Y.
2007On-the-fly interface trap measurement and its impact on the understanding of NBTI mechanism for p-MOSFETs with SiON gate dielectricLiu, W.J.; Liu, Z.Y.; Huang, D.; Liao, C.C.; Zhang, L.F.; Gan, Z.H.; Wong, W.; Shen, C.; Li, M.-F. 
2013Self-selection unipolar HfOx-Based RRAMTran, X.A.; Zhu, W.; Liu, W.J.; Yeo, Y.C. ; Nguyen, B.Y.; Yu, H.Y.
2009Studies of NBTI in pMOSFETs with thermal and plasma nitrided SiON gate oxides by OFIT and FPM methodsLiu, W.J.; Huang, D.; Sun, Q.Q.; Liao, C.C.; Zhang, L.F.; Gan, Z.H.; Wong, W.; Li, M.-F. 
Mar-2008Understand NBTI mechanism by developing novel measurement techniquesLi, M.-F. ; Huang, D.; Shen, C.; Yang, T.; Liu, W.J.; Liu, Z.