Browsing by Author Leang, S.E.

Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
Oct-1995A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETsLeang, S.E.; Chim, W.K. ; Chan, D.S.H. 
1995Characterization of hot-carrier degradation in non-isolated MOSFETs using a new gate-current measurement techniqueLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1999Comparative study of charge trapping effects in LDD surface-channel and buried-channel PMOS transistors using charge profiling and threshold voltage shift measurementsKok, C.K.; Chew, W.C.; Chim, W.K. ; Chan, D.S.H. ; Leang, S.E.
7-Sep-1997Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopyChim, W.K. ; Chan, D.S.H. ; Tao, J.M. ; Lou, C.L.; Leang, S.E.; Teow, C.K.
15-Feb-1997Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithmChim, W.K. ; Leang, S.E.; Chan, D.S.H. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K.