Browsing by Author Koh, L.S.

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Issue DateTitleAuthor(s)
2007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
2004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
2005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
Jun-1995An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodesPey, K.L.; Chim, W.K. ; Koh, L.S.; Liu, Y.Y.; Chew, S.Y.C. 
2011Backside reflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2011Characterization of MOS transistors using dynamic backside reflectance modulation techniqueTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2004Correlation of flash memory defects detected with passive and active localization techniquesQuah, A.C.T.; Phang, J.C.H. ; Li, S.; Massoodi, M.; Yuan, C.; Koh, L.S.; Chan, K.H.; Chua, C.M.
2006DC-coupled laser induced detection system for fault localization in microelectronic failure analysisQuah, A.C.T.; Koh, L.S.; Chua, C.M.; Palaniappan, M.; Chin, J.M.; Phang, J.C.H. 
2009Design considerations for refractive solid immersion lens: Application to subsurface integrated circuit fault localization using laser induced techniquesGoh, S.H.; Sheppard, C.J.R. ; Quah, A.C.T.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
2007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
2007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
2008Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniquesGoh, S.H.; Quah, A.C.T.; Sheppard, C.J.R. ; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2006Enhanced detection sensitivity with pulsed laser digital signal integration algorithmQuah, A.C.T.; Phang, J.C.H. ; Koh, L.S.; Tan, S.H.; Chua, C.M.
2009Laser timing probe with frequency mapping for locating signal maximaKoh, L.S.; Marks, H.; Ross, L.K.; Chua, C.M.; Phang, J.C.H. 
Aug-2008Laser-induced detection sensitivity enhancement with laser pulsingQuah, A.C.T.; Chua, C.M.; Tan, S.H.; Koh, L.S.; Phang, J.C.H. ; Tan, T.L.; Gan, C.L.
29-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
2008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
2007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H.