Browsing by Author Je, J.H.

Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
Jan-2003A structural study of effects of NiP seed layer on the magnetic properties of CoCrPt/Ti/NiP perpendicular magnetic filmsSun, C.J. ; Chow, G.M. ; Wang, J.P.; Soo, E.W.; Noh, D.Y.; Je, J.H.; Hwu, Y.K.
Jan-2003Edge-enhanced radiology with broadband synchrotron X-raysTsai, W.L.; Hsu, P.C.; Hwu, Y.; Je, J.H.; Ping, Y. ; Moser, H.O. ; Groso, A.; Margaritondo, G.
Dec-2004Imaging cells and tissues with refractive index radiologyHwu, Y.; Tsai, W.L.; Chang, H.M.; Yeh, H.I.; Hsu, P.C.; Yang, Y.C.; Su, Y.T.; Tsai, H.L.; Chow, G.M. ; Ho, P.C. ; Li, S.C. ; Moser, H.O. ; Yang, P. ; Seol, S.K.; Kim, C.C.; Je, J.H.; Stefanekova, E.; Groso, A.; Margaritondo, G.
20-Mar-2006Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structureSun, C.J. ; Chow, G.M. ; Han, S.-W.; Wang, J.P.; Hwu, Y.K.; Je, J.H.
20-Mar-2006Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structureSun, C.J. ; Chow, G.M. ; Han, S.-W.; Wang, J.P.; Hwu, Y.K.; Je, J.H.
15-May-2003Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin filmsSun, C.J. ; Chow, G.M. ; Wang, J.P.; Soo, E.W.; Je, J.H.
15-May-2002Long-range order and short-range order study on CoCrPt/Ti films by synchrotron x-ray scattering and extended x-ray absorption fine structure spectroscopySun, C.J. ; Chow, G.M. ; Wang, J.P.; Soo, E.W.; Hwu, Y.K.; Je, J.H.; Cho, T.S.; Lee, H.H.; Noh, D.Y.
2001Structural Effects of Ti Underlayer on CoCrPt Magnetic FilmsSun, C.J. ; Chow, G.M. ; Soo, E.W.; Wang, J.P.; Hwu, Y.K.; Cho, T.S.; Je, J.H.; Lee, H.H.; Kim, J.W.; Noh, D.Y.
4-Mar-2002Structural study of CoCrPt films by anomalous x-ray scattering and extended x-ray absorption fine structureChow, G.M. ; Sun, C.J. ; Soo, E.W.; Wang, J.P.; Lee, H.H.; Noh, D.Y.; Cho, T.S.; Je, J.H.; Hwu, Y.K.
18-Oct-1999Structure determination of nanostructured Ni-Co films by anomalous x-ray scatteringChow, G.M. ; Goh, W.C. ; Hwu, Y.K.; Cho, T.S.; Je, J.H.; Lee, H.H.; Kang, H.C.; Noh, D.Y.; Lin, C.K.; Chang, W.D.
2002Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivitySun, C.J. ; Chow, G.M. ; Wang, J.P.; Soo, E.W.; Je, J.H.