Browsing by Author Heiderhoff, R.

Showing results 1 to 12 of 12
Issue DateTitleAuthor(s)
2009Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion MicroscopyTiedemann, A.-K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
2005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
Jun-2007Characterization of electronic materials and devices by scanning near-field microscopyBalk, L.J.; Heiderhoff, R.; Phang, J.C.H. ; Thomas, Ch.
2001Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)Lee, T.H. ; Fiege, G.B.M.; Altes, A.; Zimmermann, G.; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
1999Correlation of Electronic and Thermal Properties of Short Channel nMOSFETSPalaniappan, M. ; Ng, V. ; Heiderhoff, R.; Phang, J.C.H. ; Fiege, G.B.M.; Balk, L.J.
2000Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting deviceHeiderhoff, R.; Palaniappan, M. ; Phang, J.C.H. ; Balk, L.J.
2005Dedicated near-field microscopies for electronic materials and devicesBalk, L.J.; Cramer, R.M.; Heiderhoff, R.; Phang, J.Ch. ; Sergeev, O.; Tiedemann, A.-K.
2010Determination of the local electric field strength by energy dispersive Photon Emission MicroscopyGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
2010Determination of the local electric field strength near electric breakdownGeinzer, T.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
2009Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-systemTiedemann, A.-K.; Heiderhoff, R.; Balk, L.J.; Phang, J.C.H. 
Sep-2009Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigationsTiedemann, A.-K.; Kurz, K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
2005Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopyHendarto, E.; Altes, A.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.