Browsing by Author Du, A.-Y.

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Issue DateTitleAuthor(s)
2007Localization of Cu/low-k interconnect reliability defects by pulsed laser induced techniqueTan, T.L.; Quah, A.C.T.; Gan, C.L.; Phang, J.C.H. ; Chua, C.M.; Ng, C.M.; Du, A.-Y.