Browsing by Author Cronquist, B.

Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1993New low-voltage contrast mechanism to image local defects in very thin silicon dioxide films. True oxide electron beam induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1993New low-voltage contrast mechanism to image local defects in very thin silicon dioxide films. True oxide electron beam induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1995New type of local defects in very thin silicon dioxide films on arsenic-implanted p-type siliconLau, W.S. ; Pey, K.S.; Ng, W.T.; Sane, V. ; Heng, J.M.C.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Cronquist, B.; Lee, Bob
1995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
1995Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced currentLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
1993True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide filmsLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1993True oxide electron beam induced current for low-voltage imaging of local defects in very thin silicon dioxide filmsLau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Cronquist, B.
1995Two types of local oxide/substrate defects in very thin silicon dioxide films on siliconLau, W.S. ; Sane, V. ; Pey, K.S.; Cronquist, B.