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Chong, P.F.
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Showing results 1 to 5 of 5
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Issue Date
Title
Author(s)
2000
Does short wavelength lithography process degrade the integrity of thin gate oxide?
Kim, S.J.
;
Cho, B.J.
;
Chong, P.F.
;
Chor, E.F.
;
Ang, C.H.
;
Ling, C.H.
;
Joo, M.S.
;
Yeo, I.S.
2001
Effects of electron-beam lithography on thin gate oxide reliability
Chong, P.F.
;
Cho, B.J.
;
Chor, E.F.
;
Joo, M.S.
Dec-2000
Electron-beam irradiation-induced gate oxide degradation
Cho, B.J.
;
Chong, P.F.
;
Chor, E.F.
;
Joo, M.S.
;
Yeo, I.S.
2000
Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions
Chong, P.F.
;
Cho, B.J.
;
Chor, E.F.
;
Joo, M.S.
;
Yeo, I.S.
Feb-1997
Microemulsion processing of manganese zinc ferrites
Wang, J.
;
Chong, P.F.
;
Ng, S.C.
;
Gan, L.M.
