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| Issue Date | Title | Author(s) |
| Mar-2003 | Applications of micro-Raman spectroscopy in salicide characterization for Si device fabrication | Zhao, F.F.; Chen, S.Y.; Shen, Z.X. ; Gao, X.S. ; Zheng, J.Z.; See, A.K.; Chan, L.H. |
| 2001 | Direct formation of C54 phase on the basis of C40 TiSi2 and its applications in deep sub-micron technology | Chen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H.; Li, W.S. |
| 2001 | Enhancement Effect of C40 TiSi2 on the C54 Phase Formation | Chen, S.Y.; Shen, Z.X. ; See, A.K.; Chan, L.H. |
| Nov-2002 | Excimer laser-induced Ti silicidation to eliminate the fine-line effect for integrated circuit device fabrication | Chen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; Ong, C.K. ; See, A.K.; Chan, L.H. |
| 18-Jun-2001 | Identification of refractory-metal-free C40 TiSi2 for low temperature C54 TiSi2 formation | Li, K.; Chen, S.Y.; Shen, Z.X. |
| 20-Sep-1999 | Laser-induced direct formation of C54 TiSi2 films with fine grains on c-Si substrates | Chen, S.Y.; Shen, Z.X. ; Chen, Z.D.; Chan, L.H.; See, A.K. |
| 1999 | Laser-induced formation of titanium silicides | Chen, S.Y.; Shen, Z.X. ; Chen, Z.D.; See, A.K.; Chan, L.H.; Zhang, T.J.; Tee, K.C. |
| 25-Dec-2000 | Synthesis and characterization of pure C40 TiSi2 | Chen, S.Y.; Shen, Z.X. ; Li, K.; See, A.K.; Chan, L.H. |
| 2002 | Synthesis of pure C40 TiSi2 for Si wafer fabrication | Chen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H.; Li, W.S. |
| 1-Jan-2014 | Therapeutic target database update 2014: A resource for targeted therapeutics | Qin, C.; Zhang, C.; Zhu, F.; Xu, F.; Chen, S.Y.; Zhang, P.; Li, Y.H.; Yang, S.Y.; Wei, Y.Q.; Tao, L.; Chen, Y.Z. |
