Browsing by Author Boothroyd, C.B.

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Issue DateTitleAuthor(s)
7-Sep-2000A critical condition in Fresnel diffraction used for ultra-high resolution lithographic printingBourdillon, A.J. ; Boothroyd, C.B.; Kong, J.R. ; Vladimirsky, Y.
2006Characteristics of single metallic nanowire growth via a field-emission induced processOon, C.H.; Khong, S.H. ; Boothroyd, C.B.; Thong, J.T.L. 
Oct-2003Direct observation of boron nitride nanocage growth by molecular beam nitridation and liquid-like motion of Fe-B nanoparticlesYeadon, M. ; Lin, M.; Loh, K.P. ; Boothroyd, C.B.; Fu, J.; Hu, Z.
2007Direct observation of carbon nanostructures growth using in-situ ultrahigh vacuum transmission electron microscopyFoo, Y.L.; Lin, M.; Tan, J.P.Y.; Boothroyd, C.B.; Tok, E.S. 
2004Direct observations of the nucleation and growth of NiSi 2 on Si (001)Yeadon, M. ; Nath, R.; Boothroyd, C.B.; Chi, D.Z.
2006Effect of Fe2O3 on the transport and magnetic properties of half metallic Fe3O4Tripathy, D. ; Adeyeye, A.O. ; Boothroyd, C.B.
15-May-2005Effects of buffer layer on the electronic properties of half-metallic Fe 3O 4Jain, S. ; Adeyeye, A.O. ; Boothroyd, C.B.
15-May-2005Effects of buffer layer on the electronic properties of half-metallic Fe 3O 4Jain, S. ; Adeyeye, A.O. ; Boothroyd, C.B.
15-May-2005Effects of buffer layer on the electronic properties of half-metallic Fe 3O 4Jain, S. ; Adeyeye, A.O. ; Boothroyd, C.B.
1-May-2005Electronic properties of half metallic Fe 3O 4 filmsJain, S. ; Adeyeye, A.O. ; Boothroyd, C.B.
1-Sep-1999Evaluation of silicon nitride and silicon carbide as efficient polysilicon grain-growth inhibitorsCha, C.L.; Chor, E.F. ; Jia, Y.M.; Bourdillon, A.J. ; Gong, H. ; Pan, J.S.; Zhang, A.Q.; Tang, S.K.; Boothroyd, C.B.
2005Evaluation of the strain state in SiGe/Si heterostructures by high resolution X-ray diffraction and convergent beam electron diffractionToh, S.L.; Li, K.; Ang, C.H.; Rao, R.; Er, E.; Loh, K.P. ; Boothroyd, C.B.; Chan, L.
28-Mar-2005Hexagonal close-packed Ni nanostructures grown on the (001) surface of MgOTian, W.; Sun, H.P.; Pan, X.Q.; Yu, J.H.; Yeadon, M.; Boothroyd, C.B.; Feng, Y.P. ; Lukaszew, R.A.; Clarke, R.
2005High spatial resolution mapping of strain induced by the geometry configuration in nanoscaled devicesToh, S.L.; Loh, K.P. ; See, K.S.; Boothroyd, C.B.; Li, K.; Lau, W.S.; Ang, C.H.; Chan, L.
2004High spatial resolution strain measurement of deep sub-micron semiconductor devices using CBEDToh, S.L.; Li, K.; Ang, C.H.; Er, E.; Redkar, S.; Loh, K.P. ; Boothroyd, C.B.; Chan, L.
2003In-situ growth of BN nanocagesYeadon, M. ; Lin, M.; Boothroyd, C.B.; Zheng, H.; Loh, K.P. 
7-Oct-2004Interface properties of iron oxide filmsJain, S. ; Adeyeye, A.O. ; Chan, S.Y.; Boothroyd, C.B.
2007Magnetic and transport properties of Co-doped Fe3 O4 filmsTripathy, D. ; Adeyeye, A.O. ; Boothroyd, C.B.; Piramanayagam, S.N.
2006Microstructural evolution and its influence on the magnetic properties of CoFe2 O4 powders during mechanical millingLiu, B.H. ; Ding, J. ; Dong, Z.L.; Boothroyd, C.B.; Yin, J.H.; Yi, J.B. 
2008Microstructure and magnetotransport properties of Cu doped Fe 3O4 filmsTripathy, D. ; Adeyeye, A.O. ; Boothroyd, C.B.; Shannigrahi, S.