Browsing by Author Chua, C.M.

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Showing results 14 to 25 of 25 < previous 
Issue DateTitleAuthor(s)
2008Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniquesGoh, S.H.; Quah, A.C.T.; Sheppard, C.J.R. ; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2006Enhanced detection sensitivity with pulsed laser digital signal integration algorithmQuah, A.C.T.; Phang, J.C.H. ; Koh, L.S.; Tan, S.H.; Chua, C.M.
2009Laser timing probe with frequency mapping for locating signal maximaKoh, L.S.; Marks, H.; Ross, L.K.; Chua, C.M.; Phang, J.C.H. 
Aug-2008Laser-induced detection sensitivity enhancement with laser pulsingQuah, A.C.T.; Chua, C.M.; Tan, S.H.; Koh, L.S.; Phang, J.C.H. ; Tan, T.L.; Gan, C.L.
2007Localization of Cu/low-k interconnect reliability defects by pulsed laser induced techniqueTan, T.L.; Quah, A.C.T.; Gan, C.L.; Phang, J.C.H. ; Chua, C.M.; Ng, C.M.; Du, A.-Y.
29-Aug-2011N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniquesTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
2008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
2007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
7-Jul-2011Negative backside thermoreflectance modulation of microscale metal interconnectsTeo, J.K.J.; Chua, C.M.; Koh, L.S.; Phang, J.C.H. 
2001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.
1995New type of local defects in very thin silicon dioxide films on arsenic-implanted p-type siliconLau, W.S. ; Pey, K.S.; Ng, W.T.; Sane, V. ; Heng, J.M.C.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Cronquist, B.; Lee, Bob